Presentation | 2016-03-11 A Prioritization of Combinatorial Testing Using Bayesian Inference Shunya Kawabata, Eun-Hye Choi, Osamu Mizuno, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | An ideal testing detects a large number of faults with a small number of test cases. Combinatorial testing, which focuses on a combination of parameter values, is one of the well-known techniques to produce test suites with a small number of test cases. A prioritization of combinatorial testing can detect a larger number of faults with small testing resources by setting test cases with a higher ability of fault detection earlier in a test suite. In this study, we propose a method to prioritize combinatorial testing using Bayesian inference. In our approach, we first map the probability of detecting faults to each parameter value or each combination of parameter values in test cases using Bayesian inference. We next calculate a priority weight of each test case from the mapped probabilities. We finally sort test cases in descending order of their priority weights. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Combinatorial testing / Prioritized combinatorial testing / Bayesian Inference |
Paper # | SS2015-95 |
Date of Issue | 2016-03-03 (SS) |
Conference Information | |
Committee | SS |
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Conference Date | 2016/3/10(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Shoji Yuen(Nagoya Univ.) |
Vice Chair | Kazuhiro Ogata(JAIST) |
Secretary | Kazuhiro Ogata(Tokyo Inst. of Tech.) |
Assistant | Yoshiki Higo(Osaka Univ.) |
Paper Information | |
Registration To | Technical Committee on Software Science |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Prioritization of Combinatorial Testing Using Bayesian Inference |
Sub Title (in English) | |
Keyword(1) | Combinatorial testing |
Keyword(2) | Prioritized combinatorial testing |
Keyword(3) | Bayesian Inference |
1st Author's Name | Shunya Kawabata |
1st Author's Affiliation | Kyoto Institute of Technology(Kyoto Inst. Tech.) |
2nd Author's Name | Eun-Hye Choi |
2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
3rd Author's Name | Osamu Mizuno |
3rd Author's Affiliation | Kyoto Institute of Technology(Kyoto Inst. Tech.) |
Date | 2016-03-11 |
Paper # | SS2015-95 |
Volume (vol) | vol.115 |
Number (no) | SS-508 |
Page | pp.pp.115-120(SS), |
#Pages | 6 |
Date of Issue | 2016-03-03 (SS) |