Presentation 2016-03-11
A Prioritization of Combinatorial Testing Using Bayesian Inference
Shunya Kawabata, Eun-Hye Choi, Osamu Mizuno,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) An ideal testing detects a large number of faults with a small number of test cases. Combinatorial testing, which focuses on a combination of parameter values, is one of the well-known techniques to produce test suites with a small number of test cases. A prioritization of combinatorial testing can detect a larger number of faults with small testing resources by setting test cases with a higher ability of fault detection earlier in a test suite. In this study, we propose a method to prioritize combinatorial testing using Bayesian inference. In our approach, we first map the probability of detecting faults to each parameter value or each combination of parameter values in test cases using Bayesian inference. We next calculate a priority weight of each test case from the mapped probabilities. We finally sort test cases in descending order of their priority weights.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Combinatorial testing / Prioritized combinatorial testing / Bayesian Inference
Paper # SS2015-95
Date of Issue 2016-03-03 (SS)

Conference Information
Committee SS
Conference Date 2016/3/10(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
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Topics (in English)
Chair Shoji Yuen(Nagoya Univ.)
Vice Chair Kazuhiro Ogata(JAIST)
Secretary Kazuhiro Ogata(Tokyo Inst. of Tech.)
Assistant Yoshiki Higo(Osaka Univ.)

Paper Information
Registration To Technical Committee on Software Science
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Prioritization of Combinatorial Testing Using Bayesian Inference
Sub Title (in English)
Keyword(1) Combinatorial testing
Keyword(2) Prioritized combinatorial testing
Keyword(3) Bayesian Inference
1st Author's Name Shunya Kawabata
1st Author's Affiliation Kyoto Institute of Technology(Kyoto Inst. Tech.)
2nd Author's Name Eun-Hye Choi
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
3rd Author's Name Osamu Mizuno
3rd Author's Affiliation Kyoto Institute of Technology(Kyoto Inst. Tech.)
Date 2016-03-11
Paper # SS2015-95
Volume (vol) vol.115
Number (no) SS-508
Page pp.pp.115-120(SS),
#Pages 6
Date of Issue 2016-03-03 (SS)