Presentation 2016-03-01
Power Analysis Attack for Countermeasure with Check Circuit
Yoshiya Ikezaki, Masaya Yoshikawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The thread of side-channel attack against cryptgraphic circuit is pointed out. Side-channel attack is classified into two attack methods; fault analysis attack and power analysis attack. A fault analysis attack intentionally generates operation errors during the encryption processing, and obtains confidential information using pairs of an incorrect cryptogram and a correct one. A method using a check circuit was reported as a typical measure against a fault analysis attack. A power analysis attack uses the correlation between encryption processing and power consumption. However, there is no report of which a power analysis attack is applied to check circuit. Therefore, this study proposes a new power analysis method for AES with check circuit. Experiments using an actual device prove the validity of the proposed method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AES / Power Analysis Attack / Check Circuit
Paper # VLD2015-122
Date of Issue 2016-02-22 (VLD)

Conference Information
Committee VLD
Conference Date 2016/2/29(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Okinawa Seinen Kaikan
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Yusuke Matsunaga(Kyushu Univ.)
Vice Chair Takashi Takenana(NEC)
Secretary Takashi Takenana(Ritsumeikan Univ.)
Assistant Ittetsu Taniguchi(Ritsumeikan Univ.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Power Analysis Attack for Countermeasure with Check Circuit
Sub Title (in English)
Keyword(1) AES
Keyword(2) Power Analysis Attack
Keyword(3) Check Circuit
1st Author's Name Yoshiya Ikezaki
1st Author's Affiliation Meijo University(Meijo Univ.)
2nd Author's Name Masaya Yoshikawa
2nd Author's Affiliation Meijo University(Meijo Univ.)
Date 2016-03-01
Paper # VLD2015-122
Volume (vol) vol.115
Number (no) VLD-465
Page pp.pp.67-72(VLD),
#Pages 6
Date of Issue 2016-02-22 (VLD)