Presentation 2016-02-17
Analog Circuit Design for a Precision Resistance Measurement of TSVs
Senling Wang, Keisuke Kagawa, Shuichi Kameyama, Yoshinobu Higami, Hiroshi Takahashi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # DC2015-94
Date of Issue 2016-02-10 (DC)

Conference Information
Committee DC
Conference Date 2016/2/17(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) VLSI Design and Test, etc.
Chair Nobuyasu Kanekawa(Hitachi)
Vice Chair Michiko Inoue(NAIST)
Secretary Michiko Inoue(RTRI)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analog Circuit Design for a Precision Resistance Measurement of TSVs
Sub Title (in English)
Keyword(1)
1st Author's Name Senling Wang
1st Author's Affiliation Ehime University(Ehime Univ.)
2nd Author's Name Keisuke Kagawa
2nd Author's Affiliation Ehime University(Ehime Univ.)
3rd Author's Name Shuichi Kameyama
3rd Author's Affiliation FUJITSU LTD.(Fujitsu)
4th Author's Name Yoshinobu Higami
4th Author's Affiliation Ehime University(Ehime Univ.)
5th Author's Name Hiroshi Takahashi
5th Author's Affiliation Ehime University(Ehime Univ.)
Date 2016-02-17
Paper # DC2015-94
Volume (vol) vol.115
Number (no) DC-449
Page pp.pp.49-54(DC),
#Pages 6
Date of Issue 2016-02-10 (DC)