| Presentation | 2016-02-17 Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage with short test time since BIST relies on pseudo random patterns. This paper presents a method to combine LFSR reseeding with weighted random pattern testing BIST (WRBIST) to achieve high fault coverage with short test time and small test data volume. Conventional WRBIST uses multiple weight sets to achieve high fault coverage instead of changing LFSR seed. In contrast, the proposed WRBIST uses a xed weight to save test data volume and does reseeding to improve fault coverage. Experimental results show that the proposed method can achieve higher fault coverage with short test time compared to conventional LFSR reseeding and WRBIST. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / STUMPS / LFSR / Reseeding / Weighted random pattern |
| Paper # | DC2015-92 |
| Date of Issue | 2016-02-10 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2016/2/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Nobuyasu Kanekawa(Hitachi) |
| Vice Chair | Michiko Inoue(NAIST) |
| Secretary | Michiko Inoue(RTRI) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | STUMPS |
| Keyword(3) | LFSR |
| Keyword(4) | Reseeding |
| Keyword(5) | Weighted random pattern |
| 1st Author's Name | Sayaka Satonaka |
| 1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 2nd Author's Name | Tomokazu Yoneda |
| 2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 3rd Author's Name | Yuta Yamato |
| 3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 4th Author's Name | Michiko Inoue |
| 4th Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2016-02-17 |
| Paper # | DC2015-92 |
| Volume (vol) | vol.115 |
| Number (no) | DC-449 |
| Page | pp.pp.37-42(DC), |
| #Pages | 6 |
| Date of Issue | 2016-02-10 (DC) |