Presentation 2016-02-17
Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding
Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage with short test time since BIST relies on pseudo random patterns. This paper presents a method to combine LFSR reseeding with weighted random pattern testing BIST (WRBIST) to achieve high fault coverage with short test time and small test data volume. Conventional WRBIST uses multiple weight sets to achieve high fault coverage instead of changing LFSR seed. In contrast, the proposed WRBIST uses a xed weight to save test data volume and does reseeding to improve fault coverage. Experimental results show that the proposed method can achieve higher fault coverage with short test time compared to conventional LFSR reseeding and WRBIST.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) BIST / STUMPS / LFSR / Reseeding / Weighted random pattern
Paper # DC2015-92
Date of Issue 2016-02-10 (DC)

Conference Information
Committee DC
Conference Date 2016/2/17(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) VLSI Design and Test, etc.
Chair Nobuyasu Kanekawa(Hitachi)
Vice Chair Michiko Inoue(NAIST)
Secretary Michiko Inoue(RTRI)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding
Sub Title (in English)
Keyword(1) BIST
Keyword(2) STUMPS
Keyword(3) LFSR
Keyword(4) Reseeding
Keyword(5) Weighted random pattern
1st Author's Name Sayaka Satonaka
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Tomokazu Yoneda
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yuta Yamato
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
4th Author's Name Michiko Inoue
4th Author's Affiliation Nara Institute of Science and Technology(NAIST)
Date 2016-02-17
Paper # DC2015-92
Volume (vol) vol.115
Number (no) DC-449
Page pp.pp.37-42(DC),
#Pages 6
Date of Issue 2016-02-10 (DC)