| Presentation | 2016-02-17 Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. This paper describes a new method for generating high-quality capture-power-safe at-speed scan test vectors by adjusting the impact of IR-Drop on both logic and clock paths. Experimental results on large benchmark circuits have shown the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | At-Speed Scan Test / IR-Drop / Clock Stretch / Capture-Power-Safety / Test Quality |
| Paper # | DC2015-87 |
| Date of Issue | 2016-02-10 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2016/2/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Nobuyasu Kanekawa(Hitachi) |
| Vice Chair | Michiko Inoue(NAIST) |
| Secretary | Michiko Inoue(RTRI) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation |
| Sub Title (in English) | |
| Keyword(1) | At-Speed Scan Test |
| Keyword(2) | IR-Drop |
| Keyword(3) | Clock Stretch |
| Keyword(4) | Capture-Power-Safety |
| Keyword(5) | Test Quality |
| 1st Author's Name | Fuqiang Li |
| 1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 2nd Author's Name | Xiaoqing Wen |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Stefan Holst |
| 3rd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 4th Author's Name | Kohei Miyase |
| 4th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 5th Author's Name | Seiji Kajihara |
| 5th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| Date | 2016-02-17 |
| Paper # | DC2015-87 |
| Volume (vol) | vol.115 |
| Number (no) | DC-449 |
| Page | pp.pp.7-12(DC), |
| #Pages | 6 |
| Date of Issue | 2016-02-10 (DC) |