| Presentation | 2016-02-17 Study on the Effect of Power Supply Noise on Flip-Flop Circuits Takuya Yamamoto, Yukiya Miura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | According to the scaling down, and lower power design of VLSI circuits, power supply noise such as IR-drop affects the operation of memory cells such as SRAM and FF circuits. Error occurrence on SRAM is already reported and some countermeasures are proposed. It is likely that further scaling down and lower power design will cause the error similar to that on SRAM for FF circuits and countermeasures will be needed. In this paper, we analyzed the effect of power supply noise on FF circuits and considered the cause of error occurrence. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Power Supply Noise / Flip-Flop / Latch / Bit-Flip / Malfunction |
| Paper # | DC2015-96 |
| Date of Issue | 2016-02-10 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2016/2/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Nobuyasu Kanekawa(Hitachi) |
| Vice Chair | Michiko Inoue(NAIST) |
| Secretary | Michiko Inoue(RTRI) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on the Effect of Power Supply Noise on Flip-Flop Circuits |
| Sub Title (in English) | |
| Keyword(1) | Power Supply Noise |
| Keyword(2) | Flip-Flop |
| Keyword(3) | Latch |
| Keyword(4) | Bit-Flip |
| Keyword(5) | Malfunction |
| 1st Author's Name | Takuya Yamamoto |
| 1st Author's Affiliation | Tokyo Metropolitan University(Tokyo Metropolitan Univ.) |
| 2nd Author's Name | Yukiya Miura |
| 2nd Author's Affiliation | Tokyo Metropolitan University(Tokyo Metropolitan Univ.) |
| Date | 2016-02-17 |
| Paper # | DC2015-96 |
| Volume (vol) | vol.115 |
| Number (no) | DC-449 |
| Page | pp.pp.61-66(DC), |
| #Pages | 6 |
| Date of Issue | 2016-02-10 (DC) |