| Presentation | 2016-02-17 A Ranking Method of Suspicious Candidate Faults Using Fault Excitation Condition Analysis for Universal Logical Fault Diagnosis Hideyuki Takano, Toshinori Hosokawa, Hiroshi Yamazaki, Koji Yamazaki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | DC2015-91 |
| Date of Issue | 2016-02-10 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2016/2/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Nobuyasu Kanekawa(Hitachi) |
| Vice Chair | Michiko Inoue(NAIST) |
| Secretary | Michiko Inoue(RTRI) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Ranking Method of Suspicious Candidate Faults Using Fault Excitation Condition Analysis for Universal Logical Fault Diagnosis |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Hideyuki Takano |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Hiroshi Yamazaki |
| 3rd Author's Affiliation | Nihon University(Nihon Univ.) |
| 4th Author's Name | Koji Yamazaki |
| 4th Author's Affiliation | Meiji University(Meiji Univ.) |
| Date | 2016-02-17 |
| Paper # | DC2015-91 |
| Volume (vol) | vol.115 |
| Number (no) | DC-449 |
| Page | pp.pp.31-36(DC), |
| #Pages | 6 |
| Date of Issue | 2016-02-10 (DC) |