| Presentation | 2016-01-28 Quantitative Evaluation of Tamper Resistance for Random Number Masking Ryoma Matsuhisa, Masaya Yoshikawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | When a cryptographic circuit is used, it is extremely important to verify its tamper resistance against side-channel attacks. Side-channel attacks illegally obtain confidential information using physical information, such as power consumption and electromagnetic waves generated during the encryption processing. In particular, power analysis attacks using power consumption can easily analyze confidential information. The masking is a typical measure against power analysis attacks. In this method, the correlation between power consumption and confidential information is masked by adding random numbers to intermediate data of encryption. However, there are no reports on relationship between the period and accuracy of the random number and the tamper resistance in the masking. This study verifies the tamper resistance of the masking using several random number generators. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Tamper Resistance / AES / Random Number Masking / Power Analysis Attack |
| Paper # | CAS2015-70 |
| Date of Issue | 2016-01-21 (CAS) |
| Conference Information | |
| Committee | CAS |
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| Conference Date | 2016/1/28(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Satoshi Tanaka(Murata) |
| Vice Chair | Toshihiko Takahashi(Niigata Univ.) |
| Secretary | Toshihiko Takahashi(Hitachi) |
| Assistant | Toshihiro Tachibana(Shonan Inst. of Tech.) / Yohei Nakamura(Hitachi) |
| Paper Information | |
| Registration To | Technical Committee on Circuits and Systems |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Quantitative Evaluation of Tamper Resistance for Random Number Masking |
| Sub Title (in English) | |
| Keyword(1) | Tamper Resistance |
| Keyword(2) | AES |
| Keyword(3) | Random Number Masking |
| Keyword(4) | Power Analysis Attack |
| 1st Author's Name | Ryoma Matsuhisa |
| 1st Author's Affiliation | Meijo University(Meijo Univ.) |
| 2nd Author's Name | Masaya Yoshikawa |
| 2nd Author's Affiliation | Meijo University(Meijo Univ.) |
| Date | 2016-01-28 |
| Paper # | CAS2015-70 |
| Volume (vol) | vol.115 |
| Number (no) | CAS-422 |
| Page | pp.pp.51-56(CAS), |
| #Pages | 6 |
| Date of Issue | 2016-01-21 (CAS) |