Presentation 2016-01-21
Yield evaluation of 40k gate-scale adiabatic-quantum-flux-parametron circuits
Tatsuya Narama, Naoki Takeuchi, Thomas Ortlepp, Yuki Yamanashi, Nobuyuki Yoshikawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We are studying adiabatic quantum flux parametron (AQFP) circuit, which is very energy-efficient superconductor logic. Recently, we evaluated circuit yields of 10k-gate AQFP circuit using AIST STP2. In this study, we evaluated circuit yields using a large-scale AQFP circuit composed of as many as 40,000 AQFP gates with approximately 80,000 Josephson junctions, which was fabricated using AIST HSTP. We measured 6 chips using bipolar excitation currents, which were necessary to precisely evaluate circuit yields. We iterated the measurement with temperature cycling between room temperature and 4.2 K in the liquid helium, and we confirmed 37% of AND block yield. Furthermore, we confirmed high reproducibility of the measurement.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Superconductive Integrated Circuit / Adiabatic Quantum-Flux-Parametron / Flux Trapping / Circuit Yield
Paper # SCE2015-42
Date of Issue 2016-01-14 (SCE)

Conference Information
Committee SCE
Conference Date 2016/1/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Nobuyuki Yoshikawa(Yokohama National Univ.)
Vice Chair
Secretary (Yokohama National Univ.)
Assistant Hiroyuki Akaike(Nagoya Univ.)

Paper Information
Registration To Technical Committee on Superconductive Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Yield evaluation of 40k gate-scale adiabatic-quantum-flux-parametron circuits
Sub Title (in English)
Keyword(1) Superconductive Integrated Circuit
Keyword(2) Adiabatic Quantum-Flux-Parametron
Keyword(3) Flux Trapping
Keyword(4) Circuit Yield
1st Author's Name Tatsuya Narama
1st Author's Affiliation Yokohama National University(Yokohama National Univ.)
2nd Author's Name Naoki Takeuchi
2nd Author's Affiliation Yokohama National University(Yokohama National Univ.)
3rd Author's Name Thomas Ortlepp
3rd Author's Affiliation CiS Forschungsinstitut für Mikrosensorik GmbH(CiS)
4th Author's Name Yuki Yamanashi
4th Author's Affiliation Yokohama National University(Yokohama National Univ.)
5th Author's Name Nobuyuki Yoshikawa
5th Author's Affiliation Yokohama National University(Yokohama National Univ.)
Date 2016-01-21
Paper # SCE2015-42
Volume (vol) vol.115
Number (no) SCE-412
Page pp.pp.35-40(SCE),
#Pages 6
Date of Issue 2016-01-14 (SCE)