Presentation 2016-01-21
Improvement of operational stability of SFQ logic gate with optimized Josephson comparator
Kenta Asakura, Yuki Yamanashi, Nobuyuki Yoshikawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A single-flux-quantum (SFQ) circuits has been studied because of its low power and high-speed operation. Because the bit energy of the SFQ circuit is extremely low, careful design is required to build reliable large-scale SFQ circuit that has the ultra-low error rate. In this study, we investigated improvement of a bit-error rate of the SFQ logic gate by optimizing Josephson comparators, which is a pair of serially connected Josephson junctions and make decisions of the signal outputs, in the logic gate. We have investigated the bit error rate of SFQ logic gates that have various circuit parameters and structures. Measurements result show that the bit-error rate can be improved by optimizing SFQ OR gate. The difference is 3% at the bit-error rate of 10-4.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SFQ / comparator / logic gate / gray zone width / bit-error rate
Paper # SCE2015-37
Date of Issue 2016-01-14 (SCE)

Conference Information
Committee SCE
Conference Date 2016/1/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Nobuyuki Yoshikawa(Yokohama National Univ.)
Vice Chair
Secretary (Yokohama National Univ.)
Assistant Hiroyuki Akaike(Nagoya Univ.)

Paper Information
Registration To Technical Committee on Superconductive Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improvement of operational stability of SFQ logic gate with optimized Josephson comparator
Sub Title (in English)
Keyword(1) SFQ
Keyword(2) comparator
Keyword(3) logic gate
Keyword(4) gray zone width
Keyword(5) bit-error rate
1st Author's Name Kenta Asakura
1st Author's Affiliation Yokohama National University(Yokohama Nat Univ.)
2nd Author's Name Yuki Yamanashi
2nd Author's Affiliation Yokohama National University(Yokohama Nat Univ.)
3rd Author's Name Nobuyuki Yoshikawa
3rd Author's Affiliation Yokohama National University(Yokohama Nat Univ.)
Date 2016-01-21
Paper # SCE2015-37
Volume (vol) vol.115
Number (no) SCE-412
Page pp.pp.7-10(SCE),
#Pages 4
Date of Issue 2016-01-14 (SCE)