Presentation 2016-01-29
Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network
Hanayo Fujimoto, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Most of current network node use electronic processing which needs additional conversion between optical and electrical signals will become a bottleneck.In order to overcome the issue, all-optical label processing is expected to realize a high-speed label routing network. In this report, optical neural-network circuit to process BPSK labels for photonic label routing is proposed, It is found that noise tolerance for incident labels is improved by reducing the depth of learning for weights.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical neural network / label processing / noise tolerence
Paper # PN2015-95,EMT2015-146,OPE2015-208,LQE2015-195,EST2015-152,MWP2015-121
Date of Issue 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP)

Conference Information
Committee LQE / EST / OPE / EMT / PN / MWP / IEE-EMT
Conference Date 2016/1/28(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hajime Shoji(Sumitomo Electric Industries) / Tatsuya Kashiwa(Kitami Inst. of Tech.) / Hiroyuki Uenohara(Tokyo Inst. of Tech.) / Motoyuki Sato(Tohoku Univ.) / Eiji Oki(Univ. of Electro-Comm.) / Yuichi Kado(Kyoto Inst. of Tech.) / Masahiro Tanaka(Gifu Univ.)
Vice Chair Susumu Noda(Kyoto Univ.) / Hideaki Kimura(NTT) / Akimasa Hirata(Nagoya Inst. of Tech.) / Shinichiro Ohnuki(Nihon Univ.) / Kensuke Ogawa(Fujikura) / Akira Hirose(Univ. of Tokyo) / Hiroshi Hasegawa(Nagoya Univ.) / Takehiro Tsuritani(KDDI Labs.) / Haruki Ogoshi(Furukawa Electric) / Tetsuya Kawanishi(NICT) / Hiroyuki Toda(Doshisha Univ.)
Secretary Susumu Noda(NICT) / Hideaki Kimura(NTT) / Akimasa Hirata(Tokyo Inst. of Tech.) / Shinichiro Ohnuki(Muroran Inst. of Tech.) / Kensuke Ogawa(Fujitsu Labs.) / Akira Hirose(NTT) / Hiroshi Hasegawa(Niigata Univ.) / Takehiro Tsuritani(Mitsubishi Electric) / Haruki Ogoshi(NICT) / Tetsuya Kawanishi(Osaka Univ.) / Hiroyuki Toda(ENRI) / (NTT)
Assistant / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.) / Takaaki Ishigure(Keio Univ.) / Eiji Yagyu(Mitsubishi Electric) / Kazunori Takahashi(Tohoku Univ.) / Masahiro Nakagawa(NTT) / Kensuke Ikeda(CRIEPI) / Atsushi Kanno(NICT) / Yoshihiro Naka(KUHW)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electronics Simulation Technology / Technical Committee on Optoelectronics / Technical Committee on Electromagnetic Theory / Technical Committee on Photonic Network / Technical Committee on Microwave and Millimeter-wave Photonics / Technical Meeting on Electromagnetic Theory
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network
Sub Title (in English)
Keyword(1) optical neural network
Keyword(2) label processing
Keyword(3) noise tolerence
1st Author's Name Hanayo Fujimoto
1st Author's Affiliation Tokushima University(Tokushima Univ)
2nd Author's Name Hiroki Kishikawa
2nd Author's Affiliation Tokushima University(Tokushima Univ)
3rd Author's Name Nobuo Goto
3rd Author's Affiliation Tokushima University(Tokushima Univ)
4th Author's Name Shin-ichiro Yanagiya
4th Author's Affiliation Tokushima University(Tokushima Univ)
Date 2016-01-29
Paper # PN2015-95,EMT2015-146,OPE2015-208,LQE2015-195,EST2015-152,MWP2015-121
Volume (vol) vol.115
Number (no) PN-430,EMT-431,OPE-432,LQE-433,EST-434,MWP-435
Page pp.pp.373-378(PN), pp.373-378(EMT), pp.373-378(OPE), pp.373-378(LQE), pp.373-378(EST), pp.373-378(MWP),
#Pages 6
Date of Issue 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP)