Presentation | 2016-01-29 Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network Hanayo Fujimoto, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Most of current network node use electronic processing which needs additional conversion between optical and electrical signals will become a bottleneck.In order to overcome the issue, all-optical label processing is expected to realize a high-speed label routing network. In this report, optical neural-network circuit to process BPSK labels for photonic label routing is proposed, It is found that noise tolerance for incident labels is improved by reducing the depth of learning for weights. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | optical neural network / label processing / noise tolerence |
Paper # | PN2015-95,EMT2015-146,OPE2015-208,LQE2015-195,EST2015-152,MWP2015-121 |
Date of Issue | 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP) |
Conference Information | |
Committee | LQE / EST / OPE / EMT / PN / MWP / IEE-EMT |
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Conference Date | 2016/1/28(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Hajime Shoji(Sumitomo Electric Industries) / Tatsuya Kashiwa(Kitami Inst. of Tech.) / Hiroyuki Uenohara(Tokyo Inst. of Tech.) / Motoyuki Sato(Tohoku Univ.) / Eiji Oki(Univ. of Electro-Comm.) / Yuichi Kado(Kyoto Inst. of Tech.) / Masahiro Tanaka(Gifu Univ.) |
Vice Chair | Susumu Noda(Kyoto Univ.) / Hideaki Kimura(NTT) / Akimasa Hirata(Nagoya Inst. of Tech.) / Shinichiro Ohnuki(Nihon Univ.) / Kensuke Ogawa(Fujikura) / Akira Hirose(Univ. of Tokyo) / Hiroshi Hasegawa(Nagoya Univ.) / Takehiro Tsuritani(KDDI Labs.) / Haruki Ogoshi(Furukawa Electric) / Tetsuya Kawanishi(NICT) / Hiroyuki Toda(Doshisha Univ.) |
Secretary | Susumu Noda(NICT) / Hideaki Kimura(NTT) / Akimasa Hirata(Tokyo Inst. of Tech.) / Shinichiro Ohnuki(Muroran Inst. of Tech.) / Kensuke Ogawa(Fujitsu Labs.) / Akira Hirose(NTT) / Hiroshi Hasegawa(Niigata Univ.) / Takehiro Tsuritani(Mitsubishi Electric) / Haruki Ogoshi(NICT) / Tetsuya Kawanishi(Osaka Univ.) / Hiroyuki Toda(ENRI) / (NTT) |
Assistant | / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.) / Takaaki Ishigure(Keio Univ.) / Eiji Yagyu(Mitsubishi Electric) / Kazunori Takahashi(Tohoku Univ.) / Masahiro Nakagawa(NTT) / Kensuke Ikeda(CRIEPI) / Atsushi Kanno(NICT) / Yoshihiro Naka(KUHW) |
Paper Information | |
Registration To | Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electronics Simulation Technology / Technical Committee on Optoelectronics / Technical Committee on Electromagnetic Theory / Technical Committee on Photonic Network / Technical Committee on Microwave and Millimeter-wave Photonics / Technical Meeting on Electromagnetic Theory |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network |
Sub Title (in English) | |
Keyword(1) | optical neural network |
Keyword(2) | label processing |
Keyword(3) | noise tolerence |
1st Author's Name | Hanayo Fujimoto |
1st Author's Affiliation | Tokushima University(Tokushima Univ) |
2nd Author's Name | Hiroki Kishikawa |
2nd Author's Affiliation | Tokushima University(Tokushima Univ) |
3rd Author's Name | Nobuo Goto |
3rd Author's Affiliation | Tokushima University(Tokushima Univ) |
4th Author's Name | Shin-ichiro Yanagiya |
4th Author's Affiliation | Tokushima University(Tokushima Univ) |
Date | 2016-01-29 |
Paper # | PN2015-95,EMT2015-146,OPE2015-208,LQE2015-195,EST2015-152,MWP2015-121 |
Volume (vol) | vol.115 |
Number (no) | PN-430,EMT-431,OPE-432,LQE-433,EST-434,MWP-435 |
Page | pp.pp.373-378(PN), pp.373-378(EMT), pp.373-378(OPE), pp.373-378(LQE), pp.373-378(EST), pp.373-378(MWP), |
#Pages | 6 |
Date of Issue | 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP) |