| Presentation | 2015-12-17 [Poster Presentation] An Accurate Soft Error Propagation Analysis Technique Considering Temporal Masking Disablement Yuri Nishizumi, Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A highly reliable VLSI processor is required in a wide range of fields which include automotive, medical and space application. On the other hand, technology scaling increases soft error rate, so it is necessary to evaluate influence of soft error. However, soft error propagation analysis using fault injection takes an enormous amount of time. In order to evaluate it in a short time, analytical technique is strongly required. In this paper, we propose an accurate soft error propagation analysis technique. Conventional analysis techniques have considered temporal and logical masking effect. The proposed technique considers temporal masking disablement in flip-flop under enable control, which is not considered in conventional techniques. We made a comparison between Mean Absolute Error(MAE) of conventional and that of proposed analysis techniques for six benchmarks. These results show that the proposed technique reduces 49.87% in average of MAE when the enabled probability is 0.1. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Soft error rate / Soft error propagation / Temporal masking / Logical masking |
| Paper # | ICD2015-81,CPSY2015-94 |
| Date of Issue | 2015-12-10 (ICD, CPSY) |
| Conference Information | |
| Committee | ICD / CPSY |
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| Conference Date | 2015/12/17(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Minoru Fujishima(Hiroshima Univ.) / Yasuhiko Nakashima(NAIST) |
| Vice Chair | Hideto Hidaka(Renesas) / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) / Koji Nakano(Fujitsu Labs.) / Hidetsugu Irie(NII) |
| Assistant | Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Computer Systems |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Poster Presentation] An Accurate Soft Error Propagation Analysis Technique Considering Temporal Masking Disablement |
| Sub Title (in English) | |
| Keyword(1) | Soft error rate |
| Keyword(2) | Soft error propagation |
| Keyword(3) | Temporal masking |
| Keyword(4) | Logical masking |
| 1st Author's Name | Yuri Nishizumi |
| 1st Author's Affiliation | Kobe University(Kobe Univ.) |
| 2nd Author's Name | Yuta Kimi |
| 2nd Author's Affiliation | Kobe University(Kobe Univ.) |
| 3rd Author's Name | Go Matsukawa |
| 3rd Author's Affiliation | Kobe University(Kobe Univ.) |
| 4th Author's Name | Shuhei Yoshida |
| 4th Author's Affiliation | Kobe University(Kobe Univ.) |
| 5th Author's Name | Shintaro Izumi |
| 5th Author's Affiliation | Kobe University(Kobe Univ.) |
| 6th Author's Name | Hiroshi Kawaguchi |
| 6th Author's Affiliation | Kobe University(Kobe Univ.) |
| 7th Author's Name | Masahiko Yoshimoto |
| 7th Author's Affiliation | Kobe University(Kobe Univ.) |
| Date | 2015-12-17 |
| Paper # | ICD2015-81,CPSY2015-94 |
| Volume (vol) | vol.115 |
| Number (no) | ICD-373,CPSY-374 |
| Page | pp.pp.65-65(ICD), pp.65-65(CPSY), |
| #Pages | 1 |
| Date of Issue | 2015-12-10 (ICD, CPSY) |