| Presentation | 2016-01-20 [Invited Lecture] Evaluation technology for SiC wafer and device characteristics Makoto Kitabatake, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ED2015-112 |
| Date of Issue | 2016-01-13 (ED) |
| Conference Information | |
| Committee | ED |
|---|---|
| Conference Date | 2016/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Power Devices and High-frequency Devices, Microwave, etc. |
| Chair | Koichi Maezawa(Univ. of Toyama) |
| Vice Chair | Kunio Tsuda(Toshiba) |
| Secretary | Kunio Tsuda(NEC) |
| Assistant | Manabu Arai(New JRC) / Masataka Higashiwaki(NICT) |
| Paper Information | |
| Registration To | Technical Committee on Electron Device |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] Evaluation technology for SiC wafer and device characteristics |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Makoto Kitabatake |
| 1st Author's Affiliation | R&D Partnership for Future Power Electronics Technology(FUPET) |
| Date | 2016-01-20 |
| Paper # | ED2015-112 |
| Volume (vol) | vol.115 |
| Number (no) | ED-402 |
| Page | pp.pp.1-6(ED), |
| #Pages | 6 |
| Date of Issue | 2016-01-13 (ED) |