| Presentation | 2015-12-22 Nondestructive and remote inspection applications by terahertz spectrum imaging Takashi Kimura, Yusuke Nakasato, Kensaku Maeda, Yutaka Oyama, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ED2015-107 |
| Date of Issue | 2015-12-14 (ED) |
| Conference Information | |
| Committee | ED |
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| Conference Date | 2015/12/21(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | RIEC, Tohoku Univ |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Millimeter-wave, terahertz-wave devices and systems |
| Chair | Koichi Maezawa(Univ. of Toyama) |
| Vice Chair | Kunio Tsuda(Toshiba) |
| Secretary | Kunio Tsuda(NEC) |
| Assistant | Manabu Arai(New JRC) / Masataka Higashiwaki(NICT) |
| Paper Information | |
| Registration To | Technical Committee on Electron Device |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Nondestructive and remote inspection applications by terahertz spectrum imaging |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Takashi Kimura |
| 1st Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 2nd Author's Name | Yusuke Nakasato |
| 2nd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 3rd Author's Name | Kensaku Maeda |
| 3rd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 4th Author's Name | Yutaka Oyama |
| 4th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| Date | 2015-12-22 |
| Paper # | ED2015-107 |
| Volume (vol) | vol.115 |
| Number (no) | ED-387 |
| Page | pp.pp.93-97(ED), |
| #Pages | 5 |
| Date of Issue | 2015-12-14 (ED) |