Presentation 2015-12-21
Detector Characteristics of GaAsSb-based Backward Diode Monolithically Integrated with InP-based HEMTs for 300 GHz Receiver Applications
Tsuyoshi Takahashi, Masaru Sato, Shoichi Shiba, Kozo Makiyama, Yasuhiro Nakasha, Naoki Hara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have developed receiver MMIC structure that was integrated with GaAsSb-based backward diodes and InP-based HEMTs to detect THz wave with high sensitivity. Sensitivity of 1,390 V/W was achieved at 300 GHz by adopting a matching network at the backward diodes to make an impedance matching with InP-based HEMTs. Highly sensitive THz receivers should be realized by integrating the backward diodes with InP-based HEMTs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) tunnel diode / backward / THz / HEMT / GaAsSb / detection / sensitivity / InP
Paper # ED2015-94
Date of Issue 2015-12-14 (ED)

Conference Information
Committee ED
Conference Date 2015/12/21(2days)
Place (in Japanese) (See Japanese page)
Place (in English) RIEC, Tohoku Univ
Topics (in Japanese) (See Japanese page)
Topics (in English) Millimeter-wave, terahertz-wave devices and systems
Chair Koichi Maezawa(Univ. of Toyama)
Vice Chair Kunio Tsuda(Toshiba)
Secretary Kunio Tsuda(NEC)
Assistant Manabu Arai(New JRC) / Masataka Higashiwaki(NICT)

Paper Information
Registration To Technical Committee on Electron Device
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Detector Characteristics of GaAsSb-based Backward Diode Monolithically Integrated with InP-based HEMTs for 300 GHz Receiver Applications
Sub Title (in English)
Keyword(1) tunnel diode
Keyword(2) backward
Keyword(3) THz
Keyword(4) HEMT
Keyword(5) GaAsSb
Keyword(6) detection
Keyword(7) sensitivity
Keyword(8) InP
1st Author's Name Tsuyoshi Takahashi
1st Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
2nd Author's Name Masaru Sato
2nd Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
3rd Author's Name Shoichi Shiba
3rd Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
4th Author's Name Kozo Makiyama
4th Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
5th Author's Name Yasuhiro Nakasha
5th Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
6th Author's Name Naoki Hara
6th Author's Affiliation Fujitsu Laboratories Ltd.(Fujitsu Labs.)
Date 2015-12-21
Paper # ED2015-94
Volume (vol) vol.115
Number (no) ED-387
Page pp.pp.19-23(ED),
#Pages 5
Date of Issue 2015-12-14 (ED)