Presentation | 2015-12-01 Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Outsourcing of IC fabrication components has initiated the potential threat of design tempering using hardware Trojans and also has drawn the attention of government agencies and the semiconductor industry. The added functionality, known as hardware Trojan, poses major detection and isolation challenges. This paper presents a hardware Trojan detection technique that magnifies the detection sensitivity for small Trojan in power-based side-channel analysis. A scan segmentation approach with a modified LOC test pattern application method is proposed so as to maximize dynamic power consumption of any target segment. The proposed architecture allows activating any target segment of scan chain and keeping others freeze which reduces total circuit switching activity. This helps magnify the Trojan’s contribution to selected segment by reducing dynamic power consumption. Experimental results for ISCAS89 benchmark circuit demonstrate its effectiveness in side-channel analysis. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Trojan DetectionScan ReorderingLaunch on Capture (LOC)Dynamic Power Side-ChannelTDGP |
Paper # | VLD2015-38,DC2015-34 |
Date of Issue | 2015-11-24 (VLD, DC) |
Conference Information | |
Committee | VLD / DC / IPSJ-SLDM / CPSY / RECONF / ICD / CPM |
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Conference Date | 2015/12/1(3days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Nagasaki Kinro Fukushi Kaikan |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
Chair | Yusuke Matsunaga(Kyushu Univ.) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) / Yasuhiko Nakashima(NAIST) / Minoru Watanabe(Shizuoka Univ.) / Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) |
Vice Chair | Takashi Takenana(NEC) / Michiko Inoue(NAIST) / / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Masato Motomura(Hokkaido Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) |
Secretary | Takashi Takenana(Ritsumeikan Univ.) / Michiko Inoue(Fujitsu Labs.) / (RTRI) / Koji Nakano(Kyoto Sangyo Univ.) / Hidetsugu Irie(Sharp) / Masato Motomura(Kitakyushu City Univ.) / Yuichiro Shibata(Toshiba) / Hideto Hidaka(Fujitsu Labs.) / Fumihiko Hirose(NII) |
Assistant | Ittetsu Taniguchi(Ritsumeikan Univ.) / / / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) / Kazuya Tanikagawa(Hiroshima City Univ.) / Takefumi Miyoshi(e-trees.Japan) / Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
Paper Information | |
Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan |
Sub Title (in English) | |
Keyword(1) | Trojan DetectionScan ReorderingLaunch on Capture (LOC)Dynamic Power Side-ChannelTDGP |
1st Author's Name | Fakir Sharif Hossain |
1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
2nd Author's Name | Tomokazu Yoneda |
2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
3rd Author's Name | Michiko Inoue |
3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
Date | 2015-12-01 |
Paper # | VLD2015-38,DC2015-34 |
Volume (vol) | vol.115 |
Number (no) | VLD-338,DC-339 |
Page | pp.pp.1-6(VLD), pp.1-6(DC), |
#Pages | 6 |
Date of Issue | 2015-11-24 (VLD, DC) |