| Presentation | 2015-12-01 [Fellow Memorial Lecture] Improving System Dependability by VLSI Test Technology Seiji Kajihara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | VLSI Test technology for detection of manufacturing faults has been developed to improve test quality that is the capability of fault detection and to reduce test cost, and it has contributed to the spread of VLSIs and the improvement of system reliability. In this talk, recent test technology such as big data analysis using huge manufacturing test data and field test dealing with aging is introduced. And then, expectation to provide added value for enhancements of system dependability is described. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | VLSI test / system dependability / big data / field test |
| Paper # | VLD2015-44,CPM2015-128,ICD2015-53,CPSY2015-64,DC2015-40,RECONF2015-51 |
| Date of Issue | 2015-11-24 (VLD, CPM, ICD, CPSY, DC, RECONF) |
| Conference Information | |
| Committee | VLD / DC / IPSJ-SLDM / CPSY / RECONF / ICD / CPM |
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| Conference Date | 2015/12/1(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Nagasaki Kinro Fukushi Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
| Chair | Yusuke Matsunaga(Kyushu Univ.) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) / Yasuhiko Nakashima(NAIST) / Minoru Watanabe(Shizuoka Univ.) / Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) |
| Vice Chair | Takashi Takenana(NEC) / Michiko Inoue(NAIST) / / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Masato Motomura(Hokkaido Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) |
| Secretary | Takashi Takenana(Ritsumeikan Univ.) / Michiko Inoue(Fujitsu Labs.) / (RTRI) / Koji Nakano(Kyoto Sangyo Univ.) / Hidetsugu Irie(Sharp) / Masato Motomura(Kitakyushu City Univ.) / Yuichiro Shibata(Toshiba) / Hideto Hidaka(Fujitsu Labs.) / Fumihiko Hirose(NII) |
| Assistant | Ittetsu Taniguchi(Ritsumeikan Univ.) / / / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) / Kazuya Tanikagawa(Hiroshima City Univ.) / Takefumi Miyoshi(e-trees.Japan) / Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Fellow Memorial Lecture] Improving System Dependability by VLSI Test Technology |
| Sub Title (in English) | |
| Keyword(1) | VLSI test |
| Keyword(2) | system dependability |
| Keyword(3) | big data |
| Keyword(4) | field test |
| 1st Author's Name | Seiji Kajihara |
| 1st Author's Affiliation | Kyushu Institute of Technology(KIT) |
| Date | 2015-12-01 |
| Paper # | VLD2015-44,CPM2015-128,ICD2015-53,CPSY2015-64,DC2015-40,RECONF2015-51 |
| Volume (vol) | vol.115 |
| Number (no) | VLD-338,CPM-340,ICD-341,CPSY-342,DC-339,RECONF-343 |
| Page | pp.pp.43-44(VLD), pp.9-10(CPM), pp.9-10(ICD), pp.19-20(CPSY), pp.43-44(DC), pp.19-20(RECONF), |
| #Pages | 2 |
| Date of Issue | 2015-11-24 (VLD, CPM, ICD, CPSY, DC, RECONF) |