| Presentation | 2015-12-02 Study on a tolerance for process variability in Single Slope ADC using interpolative TDC Kaihei Hotta, Kenichi Ohhata, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We proposed a novel single slope ADC using an interpolative TDC (ITDC) to develop a high-speed and low-power ADC, and reported that the proposed ADC demonstrated a high sampling frequency of 500 MHz. It is predicted that the accuracy of the ITDC is seriously degraded due to the process variability because its resolution is a half of that of the conventional TDC. Therefore, the influence of the process variability on the accuracy of the ITDC was investigated. As a result, we found that the influence of the comparator offset was negligible, and the conversion gain of the ADC considerably changed due to the delay time change of the ring oscillator, and the conversion error increased due to the timing mismatch in the sampling switch. Moreover, it was shown that the conversion error generated by above-mentioned phenomena could be compensated for by adjustment of the ramp speed and threshold voltage of the comparator. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Single slope ADC / process variability / Interpolative TDC |
| Paper # | CPM2015-131,ICD2015-56 |
| Date of Issue | 2015-11-24 (CPM, ICD) |
| Conference Information | |
| Committee | VLD / DC / IPSJ-SLDM / CPSY / RECONF / ICD / CPM |
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| Conference Date | 2015/12/1(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Nagasaki Kinro Fukushi Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
| Chair | Yusuke Matsunaga(Kyushu Univ.) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) / Yasuhiko Nakashima(NAIST) / Minoru Watanabe(Shizuoka Univ.) / Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) |
| Vice Chair | Takashi Takenana(NEC) / Michiko Inoue(NAIST) / / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Masato Motomura(Hokkaido Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) |
| Secretary | Takashi Takenana(Ritsumeikan Univ.) / Michiko Inoue(Fujitsu Labs.) / (RTRI) / Koji Nakano(Kyoto Sangyo Univ.) / Hidetsugu Irie(Sharp) / Masato Motomura(Kitakyushu City Univ.) / Yuichiro Shibata(Toshiba) / Hideto Hidaka(Fujitsu Labs.) / Fumihiko Hirose(NII) |
| Assistant | Ittetsu Taniguchi(Ritsumeikan Univ.) / / / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) / Kazuya Tanikagawa(Hiroshima City Univ.) / Takefumi Miyoshi(e-trees.Japan) / Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on a tolerance for process variability in Single Slope ADC using interpolative TDC |
| Sub Title (in English) | |
| Keyword(1) | Single slope ADC |
| Keyword(2) | process variability |
| Keyword(3) | Interpolative TDC |
| 1st Author's Name | Kaihei Hotta |
| 1st Author's Affiliation | Kagoshima University(Kagishima Univ.) |
| 2nd Author's Name | Kenichi Ohhata |
| 2nd Author's Affiliation | Kagoshima University(Kagishima Univ.) |
| Date | 2015-12-02 |
| Paper # | CPM2015-131,ICD2015-56 |
| Volume (vol) | vol.115 |
| Number (no) | CPM-340,ICD-341 |
| Page | pp.pp.23-27(CPM), pp.23-27(ICD), |
| #Pages | 5 |
| Date of Issue | 2015-11-24 (CPM, ICD) |