Presentation | 2015-12-01 On discrimination method of a resistive open using delay variation induced by signal transitions on adjacent lines Kotaro Ise, Hiroyuki Yotsuyanagi, Masaki Hashizume, Yoshinobu Higami, Hiroshi Takahashi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The effect of a resistive open results in small delay in an IC. It is difficult to test small delay since signal delay also varies by parameter variations such as transistor size. Signal delay of a line with adjacent lines is affected by the signal transition of the adjacent lines. Moreover, the delay variation also depends on the existence of a fault. In this study, a discrimination method is proposed that utilizes delay distributions obtained by the various input signals. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulatior for a line layout with adjacent lines. We investigate the effectiveness of the method that discriminates a resistive open using anomaly detection from delays obtained by the simulation. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | resistive open fault / adjacent line / signal transition |
Paper # | VLD2015-42,DC2015-38 |
Date of Issue | 2015-11-24 (VLD, DC) |
Conference Information | |
Committee | VLD / DC / IPSJ-SLDM / CPSY / RECONF / ICD / CPM |
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Conference Date | 2015/12/1(3days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Nagasaki Kinro Fukushi Kaikan |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
Chair | Yusuke Matsunaga(Kyushu Univ.) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) / Yasuhiko Nakashima(NAIST) / Minoru Watanabe(Shizuoka Univ.) / Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) |
Vice Chair | Takashi Takenana(NEC) / Michiko Inoue(NAIST) / / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Masato Motomura(Hokkaido Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) |
Secretary | Takashi Takenana(Ritsumeikan Univ.) / Michiko Inoue(Fujitsu Labs.) / (RTRI) / Koji Nakano(Kyoto Sangyo Univ.) / Hidetsugu Irie(Sharp) / Masato Motomura(Kitakyushu City Univ.) / Yuichiro Shibata(Toshiba) / Hideto Hidaka(Fujitsu Labs.) / Fumihiko Hirose(NII) |
Assistant | Ittetsu Taniguchi(Ritsumeikan Univ.) / / / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) / Kazuya Tanikagawa(Hiroshima City Univ.) / Takefumi Miyoshi(e-trees.Japan) / Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
Paper Information | |
Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | On discrimination method of a resistive open using delay variation induced by signal transitions on adjacent lines |
Sub Title (in English) | |
Keyword(1) | resistive open fault |
Keyword(2) | adjacent line |
Keyword(3) | signal transition |
1st Author's Name | Kotaro Ise |
1st Author's Affiliation | Tokushima University(Tokushima Univ.) |
2nd Author's Name | Hiroyuki Yotsuyanagi |
2nd Author's Affiliation | Tokushima University(Tokushima Univ.) |
3rd Author's Name | Masaki Hashizume |
3rd Author's Affiliation | Tokushima University(Tokushima Univ.) |
4th Author's Name | Yoshinobu Higami |
4th Author's Affiliation | Ehime University(Ehime Univ.) |
5th Author's Name | Hiroshi Takahashi |
5th Author's Affiliation | Ehime University(Ehime Univ.) |
Date | 2015-12-01 |
Paper # | VLD2015-42,DC2015-38 |
Volume (vol) | vol.115 |
Number (no) | VLD-338,DC-339 |
Page | pp.pp.31-36(VLD), pp.31-36(DC), |
#Pages | 6 |
Date of Issue | 2015-11-24 (VLD, DC) |