Presentation 2015-12-03
A Quantitative Criterion of Gate-Level Netlist Vulnerability
Masaru Oya, Youhua Shi, Noritaka Yamashita, Toshihiko Okamura, Yukiyasu Tsunoo, Masao Yanagisawa, Nozomu Togawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Recently, digital ICs are designed by outside vendors to reduce costs in semiconductor industry. This circumstance introduces risks implemented Hardware Trojans(HTs) by malicious attackers. This paper proposes an HT rank which is a new analysis criterionagainst HTs at gate-level netlists. The HT rank does not use anysimulation tools but just calculate Trojan points based on Trojan netfeatures. The HT rank successfully classifies all the gate-levelnetlists in Trust-HUB, ISCAS85, ISCAS89, and ITC99 as well as severalOpenCores designs, HT-free and HT-inserted AESnetlists into HT-inserted ones and HT-free ones. We took approximately several minutes to one day depending ona netlist to calculate an HT rank using Xeon E7-4870.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) hardware Trojan / gate-level netlist / design phase / Trojan net / Trojan point
Paper # VLD2015-59,DC2015-55
Date of Issue 2015-11-24 (VLD, DC)

Conference Information
Committee VLD / DC / IPSJ-SLDM / CPSY / RECONF / ICD / CPM
Conference Date 2015/12/1(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Nagasaki Kinro Fukushi Kaikan
Topics (in Japanese) (See Japanese page)
Topics (in English) Design Gaia 2015 -New Field of VLSI Design-
Chair Yusuke Matsunaga(Kyushu Univ.) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) / Yasuhiko Nakashima(NAIST) / Minoru Watanabe(Shizuoka Univ.) / Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.)
Vice Chair Takashi Takenana(NEC) / Michiko Inoue(NAIST) / / Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Masato Motomura(Hokkaido Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.)
Secretary Takashi Takenana(Ritsumeikan Univ.) / Michiko Inoue(Fujitsu Labs.) / (RTRI) / Koji Nakano(Kyoto Sangyo Univ.) / Hidetsugu Irie(Sharp) / Masato Motomura(Kitakyushu City Univ.) / Yuichiro Shibata(Toshiba) / Hideto Hidaka(Fujitsu Labs.) / Fumihiko Hirose(NII)
Assistant Ittetsu Taniguchi(Ritsumeikan Univ.) / / / Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) / Kazuya Tanikagawa(Hiroshima City Univ.) / Takefumi Miyoshi(e-trees.Japan) / Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Quantitative Criterion of Gate-Level Netlist Vulnerability
Sub Title (in English)
Keyword(1) hardware Trojan
Keyword(2) gate-level netlist
Keyword(3) design phase
Keyword(4) Trojan net
Keyword(5) Trojan point
1st Author's Name Masaru Oya
1st Author's Affiliation Waseda University(Waseda Univ.)
2nd Author's Name Youhua Shi
2nd Author's Affiliation Waseda University(Waseda Univ.)
3rd Author's Name Noritaka Yamashita
3rd Author's Affiliation NEC Corporation(NEC)
4th Author's Name Toshihiko Okamura
4th Author's Affiliation NEC Corporation(NEC)
5th Author's Name Yukiyasu Tsunoo
5th Author's Affiliation NEC Corporation(NEC)
6th Author's Name Masao Yanagisawa
6th Author's Affiliation Waseda University(Waseda Univ.)
7th Author's Name Nozomu Togawa
7th Author's Affiliation Waseda University(Waseda Univ.)
Date 2015-12-03
Paper # VLD2015-59,DC2015-55
Volume (vol) vol.115
Number (no) VLD-338,DC-339
Page pp.pp.141-146(VLD), pp.141-146(DC),
#Pages 6
Date of Issue 2015-11-24 (VLD, DC)