Presentation | 2015-10-25 Robustness Evaluation of Binarized Event-related Potentials Horie Ryota, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Event-related Potentials (ERPs) are evoked by a particular event and transiently appear in electroencephalography (EEG). In a standard way, ERPs are observed as small time evolution of potentials by alignment of EEG segments according to an event, averaging of the segments across trials, and consequent reduction of background EEGs. The ERPs are easily distorted by artifacts. Binarized ERPs, proposed by authors, are probability that amplitude of EEGs become positive value. The binarized ERPs are observed by binarization of EEGs and averaging of the binarized sequences. In this study, we quantitatively evaluated that features of ERPs are robustly extracted into the binarized ERPs against contamination of artifacts. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Robustness Evaluation / Binarized / Event-related Potentials / Biometrics |
Paper # | BioX2015-28,MBE2015-39,NC2015-23 |
Date of Issue | 2015-10-18 (BioX, MBE, NC) |
Conference Information | |
Committee | MBE / BioX / NC |
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Conference Date | 2015/10/25(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Osaka Electro-Communication University |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Tetsuo Kobayashi(Kyoto Univ.) / Masakatsu Nishigaki(Shizuoka Univ.) / Toshimichi Saito(Hosei Univ.) |
Vice Chair | Yutaka Fukuoka(Kogakuin Univ.) / Kazuhiko Sumi(Aoyama Gakuin Univ.) / Akira Otsuka(AIST) / Shigeo Sato(Tohoku Univ.) |
Secretary | Yutaka Fukuoka(akita noken) / Kazuhiko Sumi(Kogakuin Univ.) / Akira Otsuka(Toyama Pref. Univ.) / Shigeo Sato(NEC) |
Assistant | Takenori Oida(Kyoto Univ.) / Ryota Horie(Shibaura Inst. of Tech.) / Tetsushi Ohki(AIST) / Nobuyuki Nishiuchi(Tokyo Metropolitan Univ.) / Hiroyuki Kanbara(Tokyo Inst. of Tech.) / Hisanao Akima(Tohoku Univ.) |
Paper Information | |
Registration To | Technical Committee on ME and Bio Cybernetics / Technical Committee on Biometrics / Technical Committee on Neurocomputing |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Robustness Evaluation of Binarized Event-related Potentials |
Sub Title (in English) | |
Keyword(1) | Robustness Evaluation |
Keyword(2) | Binarized |
Keyword(3) | Event-related Potentials |
Keyword(4) | Biometrics |
1st Author's Name | Horie Ryota |
1st Author's Affiliation | Shibaura Institute of Technology(SIT) |
Date | 2015-10-25 |
Paper # | BioX2015-28,MBE2015-39,NC2015-23 |
Volume (vol) | vol.115 |
Number (no) | BioX-266,MBE-267,NC-268 |
Page | pp.pp.37-42(BioX), pp.37-42(MBE), pp.37-42(NC), |
#Pages | 6 |
Date of Issue | 2015-10-18 (BioX, MBE, NC) |