| Presentation | 2015-10-02 Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism Shin-ichi Wada, Keiji Koshida, Koichiro Sawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mechanism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed the third mechanism, namely another micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on the sliding, and smaller sized system constituted of commercial parts. In the previous paper, by the MSM2, they consider the theoretical analysis and experiments on input force waveform or output displacement response in the case of three types of input waveform as force which are a sinusoidal, a rectangular, and a pulsive ones. In this paper, they obtain the experimental results concerning ``minimal sliding amplitude'' against force waveform when resistances on electrical contacts fluctuate under the conditions which are six types of waveform as the above and three levels of frictional force which are usual (1.6 N/pin), middle (1.0 N/pin), and smaller (0.3 N/pin) between a male-pin and a female-part using the MSM2. And, they compare the differences on the above minimal sliding amplitudes under the conditions by dispersion analysis on statistical test. Consequently it is shown that that the larger the frictional force is the larger the minimal sliding amplitude is and that the amplitude in a sinusoidal one is larger than in rectangular or pulsive ones. However, it is not shown that the differences in the amplitudes in pulsive one are clear. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-sliding mechanism / minimal sliding amplitude / sinusoudal waveform / rectangular waveform / pulsive waveform / statistical analysis / degradation phenomenon |
| Paper # | EMD2015-66 |
| Date of Issue | 2015-09-25 (EMD) |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2015/10/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Fuji Electric FA Components & SystemCo.,Ltd. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Junya Sekikawa(Shizuoka Univ.) |
| Vice Chair | Yoshiteru Abe(NTT) |
| Secretary | Yoshiteru Abe(Sumitomo Denso) |
| Assistant | Shinichi Wada(TMC system) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism |
| Sub Title (in English) | The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-sliding mechanism |
| Keyword(3) | minimal sliding amplitude |
| Keyword(4) | sinusoudal waveform |
| Keyword(5) | rectangular waveform |
| Keyword(6) | pulsive waveform |
| Keyword(7) | statistical analysis |
| Keyword(8) | degradation phenomenon |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd.(TMC) |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd.(TMC) |
| 3rd Author's Name | Koichiro Sawa |
| 3rd Author's Affiliation | Nippon Institute of Technology(NIT) |
| Date | 2015-10-02 |
| Paper # | EMD2015-66 |
| Volume (vol) | vol.115 |
| Number (no) | EMD-234 |
| Page | pp.pp.37-42(EMD), |
| #Pages | 6 |
| Date of Issue | 2015-09-25 (EMD) |