Presentation 2015-10-09
Quantitative measurement of polarity-inverted piezoelectric layer thickness using scanning nonlinear dielectric microscopy
Koshiro Terada, Hiroaki Nishikawa, Yohei Tanaka, Hiroyuki Odagawa, Takahiko Yanagitani, Yasuo Cho,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # US2015-62
Date of Issue 2015-10-02 (US)

Conference Information
Committee US
Conference Date 2015/10/9(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kanazawa Institute of Technology
Topics (in Japanese) (See Japanese page)
Topics (in English) General
Chair Yoichi Itoh(Nihon Univ.)
Vice Chair Mami Matsukawa(Doshisha Univ.) / Nobuyuki Endoh(Kanagawa Univ.)
Secretary Mami Matsukawa(Univ. of Electro-Comm.) / Nobuyuki Endoh(Univ. of Electro-Comm.)
Assistant Hideyuki Hasegawa(Univ. of Toyama)

Paper Information
Registration To Technical Committee on Ultrasonics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Quantitative measurement of polarity-inverted piezoelectric layer thickness using scanning nonlinear dielectric microscopy
Sub Title (in English)
Keyword(1)
1st Author's Name Koshiro Terada
1st Author's Affiliation National Institute of Technology, Kumamoto College(NIT, Kumamoto College)
2nd Author's Name Hiroaki Nishikawa
2nd Author's Affiliation National Institute of Technology, Kumamoto College(NIT, Kumamoto College)
3rd Author's Name Yohei Tanaka
3rd Author's Affiliation National Institute of Technology, Kumamoto College(NIT, Kumamoto College)
4th Author's Name Hiroyuki Odagawa
4th Author's Affiliation National Institute of Technology, Kumamoto College(NIT, Kumamoto College)
5th Author's Name Takahiko Yanagitani
5th Author's Affiliation Waseda University(Waseda Univ.)
6th Author's Name Yasuo Cho
6th Author's Affiliation Tohoku Univerisyt(Tohoku Univ.)
Date 2015-10-09
Paper # US2015-62
Volume (vol) vol.115
Number (no) US-246
Page pp.pp.23-26(US),
#Pages 4
Date of Issue 2015-10-02 (US)