Presentation 2015-09-04
[Invited Lecture] Introduction of KEC striving for the contribution to the development of the electronics industry.
Kenji Masaoka, Kazuo Ogasawara,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) KEC Electronic Industry Development Center was established in 1961 under the support of Ministry of Economy, Trade and Industry (Previously, the Ministry of International Trade and Industry) and Osaka prefecture, for the purpose of contributing to the development of electronics industry. KEC has been promoting Committee Division Activities and Testing Division Activities. The former has been involved in providing advanced technology information and training engineers. The latter has been involved in providing Testing & Evaluation services for EMC & PS (Product Safety). Testing Division has been certificated as ISO/IEC17025 Testing Laboratory by major authorities at home and abroad. By investing in state-of-the-art measuring instruments and enhancing the testing environments, it supports EMC tests in wide range of product areas, e.g., Consumer, Industry, Medical, Automotive, Aircraft, MIL and so on.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ISO/IEC17025 / EMC testing / PS testing / iNARTE
Paper # EMCJ2015-58
Date of Issue 2015-08-28 (EMCJ)

Conference Information
Committee EMCJ
Conference Date 2015/9/4(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Keihanna Plaza
Topics (in Japanese) (See Japanese page)
Topics (in English) PCB, EMC
Chair Hideaki Sone(Tohoku Univ.)
Vice Chair Osami Wada(Kyoto Univ.)
Secretary Osami Wada(Okayama Univ.)
Assistant Atsuhiro Takahashi(Toyota Central R&D Labs.) / Yoshiki Kayano(Akita Univ.) / Yusaku Katsube(Hitachi)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Lecture] Introduction of KEC striving for the contribution to the development of the electronics industry.
Sub Title (in English) From Training engineers to the state-of-the-art EMC Testing facilities.
Keyword(1) ISO/IEC17025
Keyword(2) EMC testing
Keyword(3) PS testing
Keyword(4) iNARTE
1st Author's Name Kenji Masaoka
1st Author's Affiliation KEC Electronic Industry Development Center(KEC)
2nd Author's Name Kazuo Ogasawara
2nd Author's Affiliation KEC Electronic Industry Development Center(KEC)
Date 2015-09-04
Paper # EMCJ2015-58
Volume (vol) vol.115
Number (no) EMCJ-217
Page pp.pp.31-35(EMCJ),
#Pages 5
Date of Issue 2015-08-28 (EMCJ)