Presentation 2015-09-17
New Expression of Loss in LC Circuts
Kyohei Yamada, Naoki Sakai, Takashi Ohira,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Two kinds of geometric expressions of losses in a matching circuit are presented using a concept of length or distance. The first one, employing "Manhattan distance," describes a loss in an L-shaped matching circuit and a lucid way to reduce the loss. The second one, based on hyperbolic geometry, is for not only L-shaped circuit but also any combination of shunt/series capacitors/inductors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) matching circuit / lumped-constant element / energy loss / quality factor / Manhattan distance / Poincare metric
Paper # MW2015-88
Date of Issue 2015-09-10 (MW)

Conference Information
Committee MW / AP
Conference Date 2015/9/17(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Oyama National College of Tech.
Topics (in Japanese) (See Japanese page)
Topics (in English) Microwave and Millimeter-wave
Chair Yohei Ishikawa(Kyoto Univ.) / Keizo Cho(Chiba Inst. of Tech.)
Vice Chair Masashi Nakatsugawa(NTT) / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Hisato Iwai(Doshisha Univ.)
Secretary Masashi Nakatsugawa(NTT) / Takao Kuki(Panasonic) / Kenjiro Nishikawa(KDDI R&D Labs.) / Hisato Iwai(Niigata Univ.)
Assistant Ryo Ishikawa(Univ. of Electro-Comm.) / Naoto Sekiya(Univ. of Yamanashi) / Yuichi Kimura(Saitama Univ.)

Paper Information
Registration To Technical Committee on Microwaves / Technical Committee on Antennas and Propagation
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) New Expression of Loss in LC Circuts
Sub Title (in English)
Keyword(1) matching circuit
Keyword(2) lumped-constant element
Keyword(3) energy loss
Keyword(4) quality factor
Keyword(5) Manhattan distance
Keyword(6) Poincare metric
1st Author's Name Kyohei Yamada
1st Author's Affiliation Toyohashi University of Technology(TUT)
2nd Author's Name Naoki Sakai
2nd Author's Affiliation Toyohashi University of Technology(TUT)
3rd Author's Name Takashi Ohira
3rd Author's Affiliation Toyohashi University of Technology(TUT)
Date 2015-09-17
Paper # MW2015-88
Volume (vol) vol.115
Number (no) MW-227
Page pp.pp.9-12(MW),
#Pages 4
Date of Issue 2015-09-10 (MW)