Presentation 2015-09-01
A Quality Improvement Method for VoIP on Mobile Networks Considering Delay Spikes
Koichi Nihei, Kozo Satoda, Hiroshi Yoshida,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Quality degradation of voice communication due to delay spikes, which are sudden large increases in the packet delay, is a key issue for VoIP on mobile networks. To resolve this issue, the authors have proposed a delay spike reduction method which controls the size (voice codec type) and sending interval of voice packets according to the radio communication quality and have con rmed the effectiveness of the delay spike reduction. This paper proposes a method which controls the size and sending interval of voice packets on the basis of quality of experience (QoE). The proposed method de nes a QoE indicator considering delay spikes and controls the size and sending interval for maximizing the QoE indicator. The method improves the mean opinion score (MOS) by 0.4.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) VoIP / delay spikes / mobile networks / LTE / QoE (Quality of Experience)
Paper # CQ2015-40
Date of Issue 2015-08-25 (CQ)

Conference Information
Committee CQ
Conference Date 2015/9/1(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Kyoto Institute of Technology
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Kyoko Yamori(Asahi Univ.)
Vice Chair Takanori Hayashi(NTT) / Hideyuki Shimonishi(NEC)
Secretary Takanori Hayashi(NEC) / Hideyuki Shimonishi(Osaka Univ.)
Assistant Masahiro Yamamoto(OKI) / Bo GU(Waseda Univ.) / Hirantha Abeysekera(NTT)

Paper Information
Registration To Technical Committee on Communication Quality
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Quality Improvement Method for VoIP on Mobile Networks Considering Delay Spikes
Sub Title (in English)
Keyword(1) VoIP
Keyword(2) delay spikes
Keyword(3) mobile networks
Keyword(4) LTE
Keyword(5) QoE (Quality of Experience)
1st Author's Name Koichi Nihei
1st Author's Affiliation NEC Corporation(NEC)
2nd Author's Name Kozo Satoda
2nd Author's Affiliation NEC Corporation(NEC)
3rd Author's Name Hiroshi Yoshida
3rd Author's Affiliation NEC Corporation/Tokyo Institute of Technology(NEC/Tokyo Tech)
Date 2015-09-01
Paper # CQ2015-40
Volume (vol) vol.115
Number (no) CQ-206
Page pp.pp.1-6(CQ),
#Pages 6
Date of Issue 2015-08-25 (CQ)