Presentation 2015-08-24
Wide Band Delay Profile Measurement in UHF band
Hirokazu Sawada, Tomoshige Kan, Kentaro Ishizu, Fumihide Kojima, Hiroshi Harada,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SRW2015-13
Date of Issue 2015-08-17 (SRW)

Conference Information
Committee SRW
Conference Date 2015/8/24(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Shibaura Institute of Technology
Topics (in Japanese) (See Japanese page)
Topics (in English) WLAN, etc.
Chair Hiroshi Harada(Kyoto Univ.)
Vice Chair Masafumi Kato(Fujitsu) / Satoshi Denno(Okayama Univ.)
Secretary Masafumi Kato(NTT) / Satoshi Denno(NICT)
Assistant Wen Yun(Fujitsu) / Keiichi Mizutani(Kyoto Univ.)

Paper Information
Registration To Technical Committee on Short Range Wireless Communications
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Wide Band Delay Profile Measurement in UHF band
Sub Title (in English)
Keyword(1)
1st Author's Name Hirokazu Sawada
1st Author's Affiliation National Institute of Information and Communications Technology(NICT)
2nd Author's Name Tomoshige Kan
2nd Author's Affiliation National Institute of Information and Communications Technology(NICT)
3rd Author's Name Kentaro Ishizu
3rd Author's Affiliation National Institute of Information and Communications Technology(NICT)
4th Author's Name Fumihide Kojima
4th Author's Affiliation National Institute of Information and Communications Technology(NICT)
5th Author's Name Hiroshi Harada
5th Author's Affiliation National Institute of Information and Communications Technology(NICT)
Date 2015-08-24
Paper # SRW2015-13
Volume (vol) vol.115
Number (no) SRW-189
Page pp.pp.11-16(SRW),
#Pages 6
Date of Issue 2015-08-17 (SRW)