Presentation 2015-08-07
Discrete Fourier Transform Test Based on the Simultaneous Use of Multiple Sequences
Hiroki Okada, Ken Umeno,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this paper, we review the problems in the Discrete Fourier Transform (DFT) test included in SP800-22 released by National Institute of Standards and Technology (NIST), and propose a new DFT test that conquers the problems. While the tests in SP 800-22 test the randomness of input sequences one by one, our proposal method simultaneously uses all the sequences. Thereby, the proposal method conquers the crucial problem that the conventional DFT test regards Fourier coefficients as mutually independent stochastic variables. We also compared the sensitivity of the conventional test with that of the proposal test. As a result, we found that the proposal test is more sensitive than the conventional test.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) discrete Fourier transform / random number / statistical test / SP800-22 / NIST
Paper # CCS2015-42
Date of Issue 2015-07-30 (CCS)

Conference Information
Committee CCS
Conference Date 2015/8/6(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Dai-ichi Takimotokan (Noboribetsu, Hokkaido)
Topics (in Japanese) (See Japanese page)
Topics (in English) Network Science, etc.
Chair Hiroo Sekiya(Chiba Univ.)
Vice Chair Yasuhiro Tsubo(Ritsumeikan Univ.) / Naoki Wakamiya(Osaka Univ.)
Secretary Yasuhiro Tsubo(Kagawa National College of Tech.) / Naoki Wakamiya(Kyoto Sangyo Univ.)
Assistant Takayuki Kimura(Nippon Inst. of Tech.) / Song-Ju Kim(NIMS) / Ryo Takahashi(Kyoto Univ.) / Junnosuke Teramae(Osaka Univ.)

Paper Information
Registration To Technical Committee on Complex Communication Sciences
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Discrete Fourier Transform Test Based on the Simultaneous Use of Multiple Sequences
Sub Title (in English)
Keyword(1) discrete Fourier transform
Keyword(2) random number
Keyword(3) statistical test
Keyword(4) SP800-22
Keyword(5) NIST
1st Author's Name Hiroki Okada
1st Author's Affiliation Kyoto University(Kyoto Univ.)
2nd Author's Name Ken Umeno
2nd Author's Affiliation Kyoto University(Kyoto Univ.)
Date 2015-08-07
Paper # CCS2015-42
Volume (vol) vol.115
Number (no) CCS-178
Page pp.pp.73-78(CCS),
#Pages 6
Date of Issue 2015-07-30 (CCS)