Presentation | 2015-07-09 Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing Keisuke Nakamura, Kenji Sogo, Michiharu Yamada, Kouji Ichikawa, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EMCJ2015-32 |
Date of Issue | 2015-07-02 (EMCJ) |
Conference Information | |
Committee | EMCJ |
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Conference Date | 2015/7/9(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Young Scientist Meeting |
Chair | Hideaki Sone(Tohoku Univ.) |
Vice Chair | Osami Wada(Kyoto Univ.) |
Secretary | Osami Wada(Okayama Univ.) |
Assistant | Atsuhiro Takahashi(Toyota Central R&D Labs.) / Yoshiki Kayano(Akita Univ.) |
Paper Information | |
Registration To | Technical Committee on Electromagnetic Compatibility |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Keisuke Nakamura |
1st Author's Affiliation | DENSO CORPORATION(DENSO) |
2nd Author's Name | Kenji Sogo |
2nd Author's Affiliation | DENSO CORPORATION(DENSO) |
3rd Author's Name | Michiharu Yamada |
3rd Author's Affiliation | DENSO CORPORATION(DENSO) |
4th Author's Name | Kouji Ichikawa |
4th Author's Affiliation | DENSO CORPORATION(DENSO) |
Date | 2015-07-09 |
Paper # | EMCJ2015-32 |
Volume (vol) | vol.115 |
Number (no) | EMCJ-131 |
Page | pp.pp.7-12(EMCJ), |
#Pages | 6 |
Date of Issue | 2015-07-02 (EMCJ) |