Presentation 2015-07-09
Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing
Keisuke Nakamura, Kenji Sogo, Michiharu Yamada, Kouji Ichikawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EMCJ2015-32
Date of Issue 2015-07-02 (EMCJ)

Conference Information
Committee EMCJ
Conference Date 2015/7/9(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) Young Scientist Meeting
Chair Hideaki Sone(Tohoku Univ.)
Vice Chair Osami Wada(Kyoto Univ.)
Secretary Osami Wada(Okayama Univ.)
Assistant Atsuhiro Takahashi(Toyota Central R&D Labs.) / Yoshiki Kayano(Akita Univ.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing
Sub Title (in English)
Keyword(1)
1st Author's Name Keisuke Nakamura
1st Author's Affiliation DENSO CORPORATION(DENSO)
2nd Author's Name Kenji Sogo
2nd Author's Affiliation DENSO CORPORATION(DENSO)
3rd Author's Name Michiharu Yamada
3rd Author's Affiliation DENSO CORPORATION(DENSO)
4th Author's Name Kouji Ichikawa
4th Author's Affiliation DENSO CORPORATION(DENSO)
Date 2015-07-09
Paper # EMCJ2015-32
Volume (vol) vol.115
Number (no) EMCJ-131
Page pp.pp.7-12(EMCJ),
#Pages 6
Date of Issue 2015-07-02 (EMCJ)