Presentation 2015-06-08
Generation of Learning Images Using the Bi-dimensional Empirical Mode Decomposition in Facial recognition
Teruaki Fujiyoshi, Kuntpong Woraratpanya, Yoshimitsu Kuroki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The Empirical Mode Decomposition (EMD) divides a signal into narrowband signals called Intrinsic Mode Function (IMF), and the EMD is applied for analysis of an unsteady signal. The Bi-dimensional Empirical Mode Decomposition (BEMD), which is an extension of the EMD, is applied for image processing field widely such as illumination removal. This study purposes to generate additional learning images in facial image recognition by compounding IMFs of different images in a class. The Cone-restricted Subspace Method (CSM) is used for the recognition, which assigns a convex cone in the non-negative region for each class, and demonstrates better recognition ratio than the conventional subspace method. Experimental results show that the proposed method improves he recognition ration.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Bi-dimensional Empirical Mode Decomposition / Cone-restricted Subspace Method / Facial recognition
Paper # SIS2015-5
Date of Issue 2015-06-01 (SIS)

Conference Information
Committee SIS
Conference Date 2015/6/8(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Arkas SASEBO
Topics (in Japanese) (See Japanese page)
Topics (in English) Smart Personal Systems, etc.
Chair Mitsuji Muneyasu(Kansai Univ.)
Vice Chair Hirokazu Tanaka(Toshiba) / Takayuki Nakachi(NTT)
Secretary Hirokazu Tanaka(Nagoya City Univ.) / Takayuki Nakachi(Toshiba)
Assistant Hiroyuki Tsuji(Kanagawa Inst. of Tech.) / Hakaru Tamukoh(Kyushu Inst. of Tech.)

Paper Information
Registration To Technical Committee on Smart Info-Media System
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Generation of Learning Images Using the Bi-dimensional Empirical Mode Decomposition in Facial recognition
Sub Title (in English)
Keyword(1) Bi-dimensional Empirical Mode Decomposition
Keyword(2) Cone-restricted Subspace Method
Keyword(3) Facial recognition
1st Author's Name Teruaki Fujiyoshi
1st Author's Affiliation National Institute of Technology, Kurume College(NIT, Kurume College)
2nd Author's Name Kuntpong Woraratpanya
2nd Author's Affiliation King Mongkut's Institute of Technology Ladkrabang(KMITL)
3rd Author's Name Yoshimitsu Kuroki
3rd Author's Affiliation National Institute of Technology, Kurume College(NIT, Kurume College)
Date 2015-06-08
Paper # SIS2015-5
Volume (vol) vol.115
Number (no) SIS-75
Page pp.pp.25-28(SIS),
#Pages 4
Date of Issue 2015-06-01 (SIS)