| Presentation | 2015-06-26 Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a construction method of the ICIM-CI model is presented. A commercial LDO regulator and 2-layer printed circuit boards are used for evaluation of the proposed method. The ICIM-CI model consists of a PDN block and an IB block. The PDN block represents transmission and reflection characteristics of RF disturbance injected to an input pin of the LDO regulator. S parameter measurement and S to Z conversion give characteristics of the PDN block. The IB block is a database describing relation between an output voltage fluctuation and injunction power and the induced voltage or current of the IC pin. For construction of the IB block, the DPI measurement is used. Calculation of the voltage induced by the conducted disturbance using PDN block and comparison between this induced voltage and the IB data are able to estimate immunity characteristics of the LDO regulator. The immunity simulations agree very well with the measurement results of the LDO regulator mounted on the test PCBs which have a different bypass capacitor from the test board using for ICIM-CI model extraction. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ICIM-CI / Immunity / DPI method / Conducted disturbance / LDO regulator |
| Paper # | EMCJ2015-30 |
| Date of Issue | 2015-06-18 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / IEE-EMC / IEE-MAG |
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| Conference Date | 2015/6/25(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | KMITL, Thailand |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | EMC Joint Workshop, 2015, Bangkok |
| Chair | Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Masahiro Yamaguchi(Tohoku Univ.) |
| Vice Chair | Osami Wada(Kyoto Univ.) |
| Secretary | Osami Wada(Okayama Univ.) / (Hitachi) / (Osaka Univ.) |
| Assistant | Atsuhiro Takahashi(Toyota Central R&D Labs.) / Yoshiki Kayano(Akita Univ.) / Yu-ichi Hayashi(Tohoku Univ.) / Keiju Yamada(Toshiba Co.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Meeting on Magnetics |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance |
| Sub Title (in English) | |
| Keyword(1) | ICIM-CI |
| Keyword(2) | Immunity |
| Keyword(3) | DPI method |
| Keyword(4) | Conducted disturbance |
| Keyword(5) | LDO regulator |
| 1st Author's Name | Tohlu Matsushima |
| 1st Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 2nd Author's Name | Nobuaki Ikehara |
| 2nd Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 3rd Author's Name | Hidetoshi Miyahara |
| 3rd Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 4th Author's Name | Takashi Hisakado |
| 4th Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 5th Author's Name | Osami Wada |
| 5th Author's Affiliation | Kyoto University(Kyoto Univ.) |
| Date | 2015-06-26 |
| Paper # | EMCJ2015-30 |
| Volume (vol) | vol.115 |
| Number (no) | EMCJ-114 |
| Page | pp.pp.73-78(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2015-06-18 (EMCJ) |