Presentation 2015-05-15
Analyses for the frequency characteristics of chip capacitors and inductors
Tsugumichi Shibata,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Various types of capacitors and inductors are used depending on the desired function in an electronic circuit. It is known that they exhibit a self-resonance phenomenon in high-frequencies, and do not function as an ideal capacitor or inductor in such high-frequency region. In this report, frequency characteristics of multi-layer ceramic chip capacitor, which are widely used in high-performance communication equipments, are investigated in detail by using field simulations. Dependence of the thickness and the permittivity of multi-layer ceramics on the self-resonant characteristics are described.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Chip Capacitor / MLCC / Frequency Characteristics / Self-resonance
Paper # EST2015-10
Date of Issue 2015-05-08 (EST)

Conference Information
Committee EST
Conference Date 2015/5/15(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Hosei Univ. (Koganei Campus)
Topics (in Japanese) (See Japanese page)
Topics (in English) Simulation technology, etc.
Chair Tatsuya Kashiwa(Kitami Inst. of Tech.)
Vice Chair Tetsuo Ma(Saitama Univ.) / Hideaki Kimura(NTT) / Akimasa Hirata(Nagoya Inst. of Tech.)
Secretary Tetsuo Ma(Hosei Univ.) / Hideaki Kimura(Tokyo Inst. of Tech.) / Akimasa Hirata
Assistant Shunpei Chin(Kanagawa Univ.) / Hidetoshi Chiba(Mitsubishi Electric)

Paper Information
Registration To Technical Committee on Electronics Simulation Technology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analyses for the frequency characteristics of chip capacitors and inductors
Sub Title (in English)
Keyword(1) Chip Capacitor
Keyword(2) MLCC
Keyword(3) Frequency Characteristics
Keyword(4) Self-resonance
1st Author's Name Tsugumichi Shibata
1st Author's Affiliation Tokyo City University(TCU)
Date 2015-05-15
Paper # EST2015-10
Volume (vol) vol.115
Number (no) EST-33
Page pp.pp.51-54(EST),
#Pages 4
Date of Issue 2015-05-08 (EST)