| Presentation | 2024-03-15 Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation Toya Nakatani, Yusuke Yano, Jianqing Wang, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The International Electrotechnical Commission (IEC) has established an immunity evaluation method for automotive Ethernet transceiver ICs, which requires powered ESD testing to evaluate immunity to electrostatic discharge (ESD). In this study, first, the effect of powered ESD on the communication quality degradation of an automotive Ethernet transceiver IC was experimentally evaluated. Next, a test board and its LTspice simulation circuit were created to investigate the causes of communication errors, and the validity of the LTspice simulation circuit was verified by comparing the mixed-mode S-parameters between simulated and measured on the test board. Then, the interference voltages generated by the powered ESD test were analyzed using the verified LTspice simulation circuit, and the factors generating the communication errors were discussed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Ethernet / 100BASE-T1 / communication quality / immunity / powered ESD test / ESD |
| Paper # | EMCJ2023-111 |
| Date of Issue | 2024-03-08 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / MICT |
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| Conference Date | 2024/3/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Kimihiro Tajima(NTT-AT) / Hirokazu Tanaka(Hiroshima City Univ.) |
| Vice Chair | Yoshitaka Toyota(Okayama Univ.) / Chika Sugimoto(Yokohama National Univ.) / Daisuke Anzai(Nagoya Inst. of Tech.) |
| Secretary | Yoshitaka Toyota(Hokkaido Univ.) / Chika Sugimoto(Panasonic) / Daisuke Anzai(Okayama Pref. Univ.) |
| Assistant | Kenji Ogata(ADOX) / Taiki Nishimoto(Panasonic Industry) / Tadatoshi Sekine(Shizuoka Univ.) / Dairoku Muramatsu(Univ. of Electro & Comm.) / Natsuki Nakayama(Nagoya Univ.) / Ami Tanaka(Ritsumeikan Univ.) / Kun Li(Univ. of Electro & Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Committee on Healthcare and Medical Information Communication Technology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation |
| Sub Title (in English) | |
| Keyword(1) | Ethernet |
| Keyword(2) | 100BASE-T1 |
| Keyword(3) | communication quality |
| Keyword(4) | immunity |
| Keyword(5) | powered ESD test |
| Keyword(6) | ESD |
| 1st Author's Name | Toya Nakatani |
| 1st Author's Affiliation | Nagoya Institute of Technology(NIT) |
| 2nd Author's Name | Yusuke Yano |
| 2nd Author's Affiliation | Nagoya Institute of Technology(NIT) |
| 3rd Author's Name | Jianqing Wang |
| 3rd Author's Affiliation | Nagoya Institute of Technology(NIT) |
| Date | 2024-03-15 |
| Paper # | EMCJ2023-111 |
| Volume (vol) | vol.123 |
| Number (no) | EMCJ-445 |
| Page | pp.pp.41-46(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2024-03-08 (EMCJ) |