Presentation 2024-02-29
Estimation of the number of faults based on SRGM considering user usage patterns
Shoichoro Miyamoto, Lei Zhou, Yoshinobu Tamura, Shigeru Yamada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # R2023-55
Date of Issue 2024-02-22 (R)

Conference Information
Committee R
Conference Date 2024/2/29(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English) Reliability of Electromechanical Devices, Reliability of Computer System, Reliability General
Chair Yasushi Kadota(Ricoh)
Vice Chair Hiroyuki Okamura(Hiroshima Univ.)
Secretary Hiroyuki Okamura(Hosei Univ.)
Assistant Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Shuhei Ota(Kanagawa Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Estimation of the number of faults based on SRGM considering user usage patterns
Sub Title (in English)
Keyword(1)
1st Author's Name Shoichoro Miyamoto
1st Author's Affiliation Yamaguchi University(Yamaguchi Univ.)
2nd Author's Name Lei Zhou
2nd Author's Affiliation Yamaguchi University(Yamaguchi Univ.)
3rd Author's Name Yoshinobu Tamura
3rd Author's Affiliation Yamaguchi University(Yamaguchi Univ.)
4th Author's Name Shigeru Yamada
4th Author's Affiliation Tottori University(Tottori Univ.)
Date 2024-02-29
Paper # R2023-55
Volume (vol) vol.123
Number (no) R-399
Page pp.pp.1-5(R),
#Pages 5
Date of Issue 2024-02-22 (R)