Presentation | 2024-02-29 Estimation of the number of faults based on SRGM considering user usage patterns Shoichoro Miyamoto, Lei Zhou, Yoshinobu Tamura, Shigeru Yamada, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | R2023-55 |
Date of Issue | 2024-02-22 (R) |
Conference Information | |
Committee | R |
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Conference Date | 2024/2/29(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Reliability of Electromechanical Devices, Reliability of Computer System, Reliability General |
Chair | Yasushi Kadota(Ricoh) |
Vice Chair | Hiroyuki Okamura(Hiroshima Univ.) |
Secretary | Hiroyuki Okamura(Hosei Univ.) |
Assistant | Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Shuhei Ota(Kanagawa Univ.) |
Paper Information | |
Registration To | Technical Committee on Reliability |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Estimation of the number of faults based on SRGM considering user usage patterns |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Shoichoro Miyamoto |
1st Author's Affiliation | Yamaguchi University(Yamaguchi Univ.) |
2nd Author's Name | Lei Zhou |
2nd Author's Affiliation | Yamaguchi University(Yamaguchi Univ.) |
3rd Author's Name | Yoshinobu Tamura |
3rd Author's Affiliation | Yamaguchi University(Yamaguchi Univ.) |
4th Author's Name | Shigeru Yamada |
4th Author's Affiliation | Tottori University(Tottori Univ.) |
Date | 2024-02-29 |
Paper # | R2023-55 |
Volume (vol) | vol.123 |
Number (no) | R-399 |
Page | pp.pp.1-5(R), |
#Pages | 5 |
Date of Issue | 2024-02-22 (R) |