| Presentation | 2024-02-29 Fundamental study on individual identification using electromagnetic characteristics unique to electronic devices Tsuyoshi Kobayashi, Mio Akahori, Takahiro Horiguchi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Counterfeiting of electronic devices has become a problem, and research is being conducted on device authentication (PUF) that uses the manufacturing fluctuations of semiconductor devices and device authentication that uses the radiated noise of electronic devices. When using radiated noise, the reproducibility of the behavior of noise characteristics becomes an issue due to external noise and measurement distance issues. To address this issue, this presentation first presents experimental results for individual identification using conduction noise. In addition, since identification using noise requires the device to be operated, and the problem is that the noise characteristics change depending on the operating mode, the reflection characteristics of the external I/F terminal of the device can be easily obtained even when the power is off. We focus on this and present experimental results for individual identification using this. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electronic equipment identification / manufacturing variations / electromagnetic noise / reflection characteristics |
| Paper # | VLD2023-114,HWS2023-74,ICD2023-103 |
| Date of Issue | 2024-02-21 (VLD, HWS, ICD) |
| Conference Information | |
| Committee | VLD / HWS / ICD |
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| Conference Date | 2024/2/28(4days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Shigetoshi Nakatake(Univ. of Kitakyushu) / Daisuke Suzuki(Mitsubishi Electric) / Makoto Ikeda(Univ. of Tokyo) |
| Vice Chair | Yuichi Sakurai(Hitachi) / Yuichi Hayashi(NAIST) / Toru Akishita(Sony Semiconductor Solutions) / Hayato Wakabayashi(Sony Semiconductor Solutions) |
| Secretary | Yuichi Sakurai(Socionext) / Yuichi Hayashi(Hirosaki Univ.) / Toru Akishita(Sony Semiconductor Solutions) / Hayato Wakabayashi(AIST) |
| Assistant | Takuma Nishimoto(Hitachi) / / Ryo Shirai(Kyoto Univ.) / Jun Shiomi(Osaka Univ.) / Takeshi Kuboki(Sony Semiconductor Solutions) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Hardware Security / Technical Committee on Integrated Circuits and Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental study on individual identification using electromagnetic characteristics unique to electronic devices |
| Sub Title (in English) | |
| Keyword(1) | Electronic equipment identification |
| Keyword(2) | manufacturing variations |
| Keyword(3) | electromagnetic noise |
| Keyword(4) | reflection characteristics |
| 1st Author's Name | Tsuyoshi Kobayashi |
| 1st Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric) |
| 2nd Author's Name | Mio Akahori |
| 2nd Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric) |
| 3rd Author's Name | Takahiro Horiguchi |
| 3rd Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric) |
| Date | 2024-02-29 |
| Paper # | VLD2023-114,HWS2023-74,ICD2023-103 |
| Volume (vol) | vol.123 |
| Number (no) | VLD-390,HWS-391,ICD-392 |
| Page | pp.pp.89-93(VLD), pp.89-93(HWS), pp.89-93(ICD), |
| #Pages | 5 |
| Date of Issue | 2024-02-21 (VLD, HWS, ICD) |