Presentation 2023-12-01
Fabrication of GaN-based VCSELs with cavity length control including ITO electrode and Nb2O5 spacer
Ruka Watanabe, Kenta Kobayashi, Mitsuki Yanagawa, Tetsuya Takeuchi, Satoshi Kamiyama, Motoaki Iwaya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the fabrication of vertical-cavity surface-emitting lasers (VCSELs), high controllability of the resonance wavelength, in other words cavity length, is essential. In GaAs-based VCSELs, an in-situ reflectivity spectra measurement during the epitaxial growth have been reported as a useful tool for the precise cavity length control. The use of this tool is also expected to improve the controllability of GaN-based VCSELs, and this research group reported the cavity length control of GaN-based VCSELs with the above measurement. On the other hand, there are ITO electrode and Nb2O5 spacer formed in the subsequent process steps in that cavity, and in-situ reflectivity spectra measurements during epitaxial growth is insufficient. In this report, we first deposited ITO or Nb2O5 on GaN cavity samples controlled by in-situ reflectivity spectra measurements to obtain the thickness dependence of the resonance wavelength shift, in other words the information including the refractive index. Next, we fabricated a GaN-based VCSEL with a 4λ cavity including ITO electrode and Nb2O5 spacer based on a layer design using the derived refractive index. As a result, we demonstrated room-temperature continuous operation of a GaN-based VCSEL with a difference from the designed resonance wavelength of less than 0.3% and an optical output power of 11 mW.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) semiconductor / VCSEL / cavity length control / in-situ reflectivity spectra measurement
Paper # ED2023-32,CPM2023-74,LQE2023-72
Date of Issue 2023-11-23 (ED, CPM, LQE)

Conference Information
Committee LQE / ED / CPM
Conference Date 2023/11/30(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Kosuke Nishimura(KDDI Research) / Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.)
Vice Chair Atsushi Yamaguchi(Kanazawa Inst. of Tech.) / Manabu Arai(Nagoya Univ.) / Tomoaki Terasako(Ehime Univ.)
Secretary Atsushi Yamaguchi(Fujitsu) / Manabu Arai(Yokohama National Univ.) / Tomoaki Terasako(Saga Univ.)
Assistant Keita Mochiduki(Yokohama National Univ.) / Masatoshi Koyama(Osaka Inst. of Tech.) / Tomohiro Yoshida(SUMITOMO ELECTRIC DEVICE INNOVATIONS) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Yuichi Nakamura(Toyohashi Univ. of Tech.)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of GaN-based VCSELs with cavity length control including ITO electrode and Nb2O5 spacer
Sub Title (in English)
Keyword(1) semiconductor
Keyword(2) VCSEL
Keyword(3) cavity length control
Keyword(4) in-situ reflectivity spectra measurement
1st Author's Name Ruka Watanabe
1st Author's Affiliation Meijo University(Meijo Univ.)
2nd Author's Name Kenta Kobayashi
2nd Author's Affiliation Meijo University(Meijo Univ.)
3rd Author's Name Mitsuki Yanagawa
3rd Author's Affiliation Meijo University(Meijo Univ.)
4th Author's Name Tetsuya Takeuchi
4th Author's Affiliation Meijo University(Meijo Univ.)
5th Author's Name Satoshi Kamiyama
5th Author's Affiliation Meijo University(Meijo Univ.)
6th Author's Name Motoaki Iwaya
6th Author's Affiliation Meijo University(Meijo Univ.)
Date 2023-12-01
Paper # ED2023-32,CPM2023-74,LQE2023-72
Volume (vol) vol.123
Number (no) ED-288,CPM-289,LQE-290
Page pp.pp.80-83(ED), pp.80-83(CPM), pp.80-83(LQE),
#Pages 4
Date of Issue 2023-11-23 (ED, CPM, LQE)