Presentation 2023-12-01
Simultaneous microscopic PA/PL line-scan measurements in InGaN-QWs on Stripecore GaN Substrate
Syoki Jinno, Keito Mori-Tamamura, Atsushi A. Yamaguchi, Susumu Kusanagi, Yuya Kanitani, Shigetaka Tomiya, Yoshihiro Kudo,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Accurate measurement of internal quantum efficiency (IQE) is necessary for a comprehensive understanding of the electronic structures and carrier dynamics in InGaN quantum-well emitting layers, and we have proposed simultaneous photoacoustic (PA) and photoluminescence (PL) measurements for such accurate IQE estimation. In this study, we have performed line-scan measurements of the simultaneous PA and PL measurements for InGaN quantum wells on a stripe-core GaN substrate, where the defect density spatially varies significantly. The results show that the PA and PL signal intensities show complemental relationship, which is quite reasonable. However, the data are affected by substrate absorption of the excitation light, and such effects should be removed to estimate accurate IQE values from the measurement data
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InGaN Quantum Well / Simultaneous photoacoustic / Photoluminescence measurements / Internal quantum efficiency
Paper # ED2023-25,CPM2023-67,LQE2023-65
Date of Issue 2023-11-23 (ED, CPM, LQE)

Conference Information
Committee LQE / ED / CPM
Conference Date 2023/11/30(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Kosuke Nishimura(KDDI Research) / Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.)
Vice Chair Atsushi Yamaguchi(Kanazawa Inst. of Tech.) / Manabu Arai(Nagoya Univ.) / Tomoaki Terasako(Ehime Univ.)
Secretary Atsushi Yamaguchi(Fujitsu) / Manabu Arai(Yokohama National Univ.) / Tomoaki Terasako(Saga Univ.)
Assistant Keita Mochiduki(Yokohama National Univ.) / Masatoshi Koyama(Osaka Inst. of Tech.) / Tomohiro Yoshida(SUMITOMO ELECTRIC DEVICE INNOVATIONS) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Yuichi Nakamura(Toyohashi Univ. of Tech.)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Simultaneous microscopic PA/PL line-scan measurements in InGaN-QWs on Stripecore GaN Substrate
Sub Title (in English)
Keyword(1) InGaN Quantum Well
Keyword(2) Simultaneous photoacoustic
Keyword(3) Photoluminescence measurements
Keyword(4) Internal quantum efficiency
1st Author's Name Syoki Jinno
1st Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tech.)
2nd Author's Name Keito Mori-Tamamura
2nd Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tech.)
3rd Author's Name Atsushi A. Yamaguchi
3rd Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tech.)
4th Author's Name Susumu Kusanagi
4th Author's Affiliation Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.)
5th Author's Name Yuya Kanitani
5th Author's Affiliation Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.)
6th Author's Name Shigetaka Tomiya
6th Author's Affiliation Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.)
7th Author's Name Yoshihiro Kudo
7th Author's Affiliation Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.)
Date 2023-12-01
Paper # ED2023-25,CPM2023-67,LQE2023-65
Volume (vol) vol.123
Number (no) ED-288,CPM-289,LQE-290
Page pp.pp.52-55(ED), pp.52-55(CPM), pp.52-55(LQE),
#Pages 4
Date of Issue 2023-11-23 (ED, CPM, LQE)