Presentation | 2023-12-01 Simultaneous microscopic PA/PL line-scan measurements in InGaN-QWs on Stripecore GaN Substrate Syoki Jinno, Keito Mori-Tamamura, Atsushi A. Yamaguchi, Susumu Kusanagi, Yuya Kanitani, Shigetaka Tomiya, Yoshihiro Kudo, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Accurate measurement of internal quantum efficiency (IQE) is necessary for a comprehensive understanding of the electronic structures and carrier dynamics in InGaN quantum-well emitting layers, and we have proposed simultaneous photoacoustic (PA) and photoluminescence (PL) measurements for such accurate IQE estimation. In this study, we have performed line-scan measurements of the simultaneous PA and PL measurements for InGaN quantum wells on a stripe-core GaN substrate, where the defect density spatially varies significantly. The results show that the PA and PL signal intensities show complemental relationship, which is quite reasonable. However, the data are affected by substrate absorption of the excitation light, and such effects should be removed to estimate accurate IQE values from the measurement data |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | InGaN Quantum Well / Simultaneous photoacoustic / Photoluminescence measurements / Internal quantum efficiency |
Paper # | ED2023-25,CPM2023-67,LQE2023-65 |
Date of Issue | 2023-11-23 (ED, CPM, LQE) |
Conference Information | |
Committee | LQE / ED / CPM |
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Conference Date | 2023/11/30(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Kosuke Nishimura(KDDI Research) / Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.) |
Vice Chair | Atsushi Yamaguchi(Kanazawa Inst. of Tech.) / Manabu Arai(Nagoya Univ.) / Tomoaki Terasako(Ehime Univ.) |
Secretary | Atsushi Yamaguchi(Fujitsu) / Manabu Arai(Yokohama National Univ.) / Tomoaki Terasako(Saga Univ.) |
Assistant | Keita Mochiduki(Yokohama National Univ.) / Masatoshi Koyama(Osaka Inst. of Tech.) / Tomohiro Yoshida(SUMITOMO ELECTRIC DEVICE INNOVATIONS) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
Paper Information | |
Registration To | Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Simultaneous microscopic PA/PL line-scan measurements in InGaN-QWs on Stripecore GaN Substrate |
Sub Title (in English) | |
Keyword(1) | InGaN Quantum Well |
Keyword(2) | Simultaneous photoacoustic |
Keyword(3) | Photoluminescence measurements |
Keyword(4) | Internal quantum efficiency |
1st Author's Name | Syoki Jinno |
1st Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
2nd Author's Name | Keito Mori-Tamamura |
2nd Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
3rd Author's Name | Atsushi A. Yamaguchi |
3rd Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
4th Author's Name | Susumu Kusanagi |
4th Author's Affiliation | Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.) |
5th Author's Name | Yuya Kanitani |
5th Author's Affiliation | Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.) |
6th Author's Name | Shigetaka Tomiya |
6th Author's Affiliation | Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.) |
7th Author's Name | Yoshihiro Kudo |
7th Author's Affiliation | Sony Semiconductor Solutions Corporation(Sony Semiconductor Solutions Corp.) |
Date | 2023-12-01 |
Paper # | ED2023-25,CPM2023-67,LQE2023-65 |
Volume (vol) | vol.123 |
Number (no) | ED-288,CPM-289,LQE-290 |
Page | pp.pp.52-55(ED), pp.52-55(CPM), pp.52-55(LQE), |
#Pages | 4 |
Date of Issue | 2023-11-23 (ED, CPM, LQE) |