| Presentation | 2023-11-16 MTJ-PUF with Input Decoder and Evaluation of Machine Learning Resistance Takumi Kikuchi, Kimiyoshi Usami, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Physically Unclonable Function (PUF), one of the LSI individual authentication techniques, is vulnerable to machine learning (ML) modeling attacks. In this paper, we propose an input-decoder type MTJ-PUF that uses the variation of MTJ (Magnetic Tunnel Junction) during manufacturing to improve the resistance against modeling attacks. We evaluated the vulnerability of the proposed MTJ-PUF to modeling attacks using the multilayer perceptron (MLP), linear regression (LR), and support vector machine (SVM). Results demonstrated that the prediction accuracy of each modeling attack is close to the ideal value of 50%, indicating that the proposed input decoder MTJ-PUF is resistant to ML attack. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | MTJ / PUF / Security / Manufacturing Variability |
| Paper # | VLD2023-44,ICD2023-52,DC2023-51,RECONF2023-47 |
| Date of Issue | 2023-11-08 (VLD, ICD, DC, RECONF) |
| Conference Information | |
| Committee | VLD / DC / RECONF / ICD / IPSJ-SLDM |
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| Conference Date | 2023/11/15(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Civic Auditorium Sears Home Yume Hall |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2023 -New Field of VLSI Design- |
| Chair | Shigetoshi Nakatake(Univ. of Kitakyushu) / Tatsuhiro Tsuchiya(Osaka Univ.) / Yoshiki Yamaguchi(Tsukuba Univ.) / Makoto Ikeda(Univ. of Tokyo) / Hiroyuki Ochi(Ritsumeikan Univ.) |
| Vice Chair | Yuichi Sakurai(Hitachi) / Toshinori Hosokawa(Nihon Univ.) / Yasushi Inoguchi(JAIST) / Tomonori Izumi(Ritsumeikan Univ.) / Hayato Wakabayashi(Sony Semiconductor Solutions) |
| Secretary | Yuichi Sakurai(Socionext) / Toshinori Hosokawa(Hirosaki Univ.) / Yasushi Inoguchi(Nihon Univ.) / Tomonori Izumi(Chiba Univ.) / Hayato Wakabayashi(NEC) / (Toyohashi Univ. of Tech.) |
| Assistant | Takuma Nishimoto(Hitachi) / / Yukitaka Takemura(INTEL) / Yasunori Osana(Kumamoto Univ.) / Ryo Shirai(Kyoto Univ.) / Jun Shiomi(Osaka Univ.) / Takeshi Kuboki(Kumamoto University) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Special Interest Group on System and LSI Design Methodology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | MTJ-PUF with Input Decoder and Evaluation of Machine Learning Resistance |
| Sub Title (in English) | |
| Keyword(1) | MTJ |
| Keyword(2) | PUF |
| Keyword(3) | Security |
| Keyword(4) | Manufacturing Variability |
| 1st Author's Name | Takumi Kikuchi |
| 1st Author's Affiliation | Shibaura Institute of Technology(SIT) |
| 2nd Author's Name | Kimiyoshi Usami |
| 2nd Author's Affiliation | Shibaura Institute of Technology(SIT) |
| Date | 2023-11-16 |
| Paper # | VLD2023-44,ICD2023-52,DC2023-51,RECONF2023-47 |
| Volume (vol) | vol.123 |
| Number (no) | VLD-258,ICD-259,DC-260,RECONF-261 |
| Page | pp.pp.82-87(VLD), pp.82-87(ICD), pp.82-87(DC), pp.82-87(RECONF), |
| #Pages | 6 |
| Date of Issue | 2023-11-08 (VLD, ICD, DC, RECONF) |