Presentation 2023-07-24
Improving Non-profiled DL-based Side-Channel Attack Using Multiple Partial Key Difference Estimation
Rikuma Tanaka, Rei Ueno, Akira Ito, Naofumi Homma,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper presents a method of improving Non-profiled Deep-Learning Side-Channel Attack (DL-SCA) of AES. The previous methods train an Neural Network (NN) to estimate plaintext using side-channel traces of the 1st byte S-box operation in the 1st round of target implementation and estimate the difference of partial keys between the 1st byte to other 15 bytes (the 2nd--16th bytes) from side-channel traces of the 2nd--16th byte S-box operations using pre-trained NN. The previous method uses only the 1st-byte side-channel traces for NN training and does not use the 2nd--16th bytes side-channel traces effectively. In the proposed method, we improve the attack performance by performing NN training 16 times using not only the 1st byte but also the other 2nd--16th byte side-channel traces and estimating the difference of partial keys using each pre-trained NN. We confirm the advantage of the proposed method in comparison with the previous ones through actual experiments.
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Keyword(in English)
Paper # ISEC2023-16,SITE2023-10,BioX2023-19,HWS2023-16,ICSS2023-13,EMM2023-16
Date of Issue 2023-07-17 (ISEC, SITE, BioX, HWS, ICSS, EMM)

Conference Information
Committee EMM / BioX / ISEC / SITE / ICSS / HWS / IPSJ-CSEC / IPSJ-SPT
Conference Date 2023/7/24(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Hokkaido Jichiro Kaikan
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Michiharu Niimi(Kyushu Inst. of Tech.) / hironobu Takano(Toyama Prefectural Univ.) / Goichiro Hanaoka(AIST) / Takushi Otani(Kibi International Univ.) / Daisuke Inoue(NICT) / Daisuke Suzuki(Mitsubishi Electric)
Vice Chair Kotaro Sonoda(Nagasaki Univ.) / Hyunho Kang(NIT, Tokyo) / Norihiro Okui(KDDI Research) / Emiko Sano(Kubota) / Junji Shikata(Yokohama National Univ.) / Shinsaku Kiyomoto(KDDI Research) / Soichiro Morishita(Cyber Agent) / Takeo Tatsumi(Open Univ. of Japan) / Akira Yamada(Kobe Univ.) / Toshihiro Yamauchi(Okayama Univ.) / Yuichi Hayashi(NAIST) / Toru Akishita(Sony Semiconductor Solutions)
Secretary Kotaro Sonoda(Hiroshima City Univ.) / Hyunho Kang(Osaka Inst. of Tech.) / Norihiro Okui(NEC) / Emiko Sano(Gunma Univ) / Junji Shikata(AIST) / Shinsaku Kiyomoto(Toshiba) / Soichiro Morishita(NRI-Secure) / Takeo Tatsumi(Fukuoka Inst. of Tech.) / Akira Yamada(Mitsubishi Electric) / Toshihiro Yamauchi(Univ. of Electro-Comm.) / Yuichi Hayashi(Sony Semiconductor Solutions) / Toru Akishita(AIST)
Assistant Naofumi Aoki(Hokkaido Univ.) / Kazuaki Nakamura(Tokyo Univ. of Science) / Tomokazu Kawahara(Toshiba) / Shinichi Shirakawa(Yokohama National Univ.) / Hiroki Okada(KDDI Research) / Yusuke Kaneko(Japan Research Institute) / Yo Kanemoto(NTT) / Masaya Sato(Okayama Prefectural Univ.)

Paper Information
Registration To Technical Committee on Enriched MultiMedia / Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improving Non-profiled DL-based Side-Channel Attack Using Multiple Partial Key Difference Estimation
Sub Title (in English)
Keyword(1)
Keyword(2)
Keyword(3)
Keyword(4)
1st Author's Name Rikuma Tanaka
1st Author's Affiliation Tohoku University(Tohoku Univ.)
2nd Author's Name Rei Ueno
2nd Author's Affiliation Tohoku University(Tohoku Univ.)
3rd Author's Name Akira Ito
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation(NTT)
4th Author's Name Naofumi Homma
4th Author's Affiliation Tohoku University(Tohoku Univ.)
Date 2023-07-24
Paper # ISEC2023-16,SITE2023-10,BioX2023-19,HWS2023-16,ICSS2023-13,EMM2023-16
Volume (vol) vol.123
Number (no) ISEC-129,SITE-130,BioX-131,HWS-132,ICSS-133,EMM-134
Page pp.pp.13-18(ISEC), pp.13-18(SITE), pp.13-18(BioX), pp.13-18(HWS), pp.13-18(ICSS), pp.13-18(EMM),
#Pages 6
Date of Issue 2023-07-17 (ISEC, SITE, BioX, HWS, ICSS, EMM)