Presentation | 2023-07-06 Effects of Parasitic Elements on LC/CL Matching Circuits Satoshi Tanaka, Takeshi Yoshida, Minoru Fujishima, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | L-type LC/CL matching circuits are well known for their simple analytical solutions, and have been applied to many radio frequency (RF) circuits. When actually constructing a circuit, parasitic elements are added to inductors and capacitors. Therefore, each L and C element has a self-resonant frequency, which affects the characteristics of the matching circuit. In this paper, the parallel parasitic capacitance to the inductor and the series parasitic inductor to the capacitance are taken up as parasitic elements, and the details of the effects of the self-resonant frequency of each element on the S11, voltage standing wave ratio (VSWR) and S21 characteristics are reported. When a parasitic element is added, each characteristic basically tends to deteriorate as the self-resonant frequency decreases. However, as an interesting feature, we found that the combination of resonant frequencies determines the VSWR and passband characteristics, regardless of whether it is the inductor or the capacitor. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Matching circuit / Parasitic element / Analytical solution / LC/CL |
Paper # | CAS2023-11,VLD2023-11,SIP2023-27,MSS2023-11 |
Date of Issue | 2023-06-29 (CAS, VLD, SIP, MSS) |
Conference Information | |
Committee | MSS / CAS / SIP / VLD |
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Conference Date | 2023/7/6(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Shingo Yamaguchi(Yamaguchi Univ.) / Yasutoshi Aibara(OmniVision) / Takayuki Nakachi(Ryukyu Univ.) / Shigetoshi Nakatake(Univ. of Kitakyushu) |
Vice Chair | Toshiyuki Miyamoto(Osaka Inst. of Tech.) / Norihiko Shinomiya(Soka Univ.) / Koichi Ichige(Yokohama National Univ.) / Kiyoshi Nishikawa(okyo Metropolitan Univ.) / Yuichi Sakurai(Hitachi) |
Secretary | Toshiyuki Miyamoto(Osaka Univ.) / Norihiko Shinomiya(NEC) / Koichi Ichige(Soka Univ.) / Kiyoshi Nishikawa(Renesas Electronics) / Yuichi Sakurai(Chiba Univ.) |
Assistant | Masato Shirai(Shimane Univ.) / Nao Ito(NIT, Toyama college) / Motoi Yamaguchi(TECHNOPRO) / Shinji Shimoda(Sony Semiconductor Solutions) / Shunsuke Koshita(Hachinohe Inst. of Tech.) / Taichi Yoshida(UEC) / Sayaka Shiota(Tokyo Metropolitan Univ.) / Takuma Nishimoto(Hitachi) |
Paper Information | |
Registration To | Technical Committee on Mathematical Systems Science and its Applications / Technical Committee on Circuits and Systems / Technical Committee on Signal Processing / Technical Committee on VLSI Design Technologies |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Effects of Parasitic Elements on LC/CL Matching Circuits |
Sub Title (in English) | |
Keyword(1) | Matching circuit |
Keyword(2) | Parasitic element |
Keyword(3) | Analytical solution |
Keyword(4) | LC/CL |
1st Author's Name | Satoshi Tanaka |
1st Author's Affiliation | Hiroshima University(Hiroshima Univ.) |
2nd Author's Name | Takeshi Yoshida |
2nd Author's Affiliation | Hiroshima University(Hiroshima Univ.) |
3rd Author's Name | Minoru Fujishima |
3rd Author's Affiliation | Hiroshima University(Hiroshima Univ.) |
Date | 2023-07-06 |
Paper # | CAS2023-11,VLD2023-11,SIP2023-27,MSS2023-11 |
Volume (vol) | vol.123 |
Number (no) | CAS-97,VLD-98,SIP-99,MSS-100 |
Page | pp.pp.53-58(CAS), pp.53-58(VLD), pp.53-58(SIP), pp.53-58(MSS), |
#Pages | 6 |
Date of Issue | 2023-06-29 (CAS, VLD, SIP, MSS) |