Presentation | 2023-04-10 12-nm FinFETおよび28-nm プレナー型SRAMのミューオン起因ソフトエラー断面積の評価 , , , , , , , , , , , , , , , |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
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Paper # | ICD2023-3 |
Date of Issue | 2023-04-03 (ICD) |
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Committee | ICD |
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Conference Date | 2023/4/10(2days) |
Place (in Japanese) | (See Japanese page) |
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Chair | Masafumi Takahashi(Kioxia) |
Vice Chair | Makoto Ikeda(Univ. of Tokyo) |
Secretary | Makoto Ikeda(TSMC) |
Assistant | Yoshiaki Yoshihara(Kioxia) / Jun Shiomi(Osaka Univ.) / Takeshi Kuboki(Sony Semiconductor Solutions) |
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Registration To | Technical Committee on Integrated Circuits and Devices |
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Language | JPN-ONLY |
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Date | 2023-04-10 |
Paper # | ICD2023-3 |
Volume (vol) | vol.123 |
Number (no) | ICD-1 |
Page | pp.pp.8-8(ICD), |
#Pages | 1 |
Date of Issue | 2023-04-03 (ICD) |