| Presentation | 2023-05-25 Device Identification of Different Types of ZigBee Devices Based on RF Circuit Imperfections Kota Mizumachi, Shohei Matsuoka, Kazuki Komatsu, Yuichi Miyaji, Hideyuki Uehara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the spread of the Internet of Things (IoT), there is a growing demand for enhanced security. Conventional authentication methods for wireless communication use IP addresses or MAC addresses. However, these methods have vulnerability for spoofing IP addresses. In previous researches, the method to identify devices using the imperfections of radio frequency circuits has been studied. The purpose of this study is to assess the effectiveness of the device identification method suggested by previous study and to evaluate the accuracy of device identification when XBee and TWELITE DIP are mixed, and to identify whether it is XBee or TWELITE DIP. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Device Identification / Frequency Offset / IQ Imbalance |
| Paper # | RCS2023-15 |
| Date of Issue | 2023-05-18 (RCS) |
| Conference Information | |
| Committee | RCS / IN |
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| Conference Date | 2023/5/25(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Keio University (Hiyoshi Campus), and online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Ad-Hoc/Sensor Networks/MANET, Mobile Networks, M2M/IoT Communications, Wi-Fi, IEEE802.15(ZigBee) and others |
| Chair | Kenichi Higuchi(Tokyo Univ. of Science) / Kunio Hato(Internet Multifeed) |
| Vice Chair | Tomoya Tandai(Toshiba) / Fumihide Kojima(NICT) / Osamu Muta(Kyushu Univ.) / Tsutomu Murase(Nagoya Univ.) |
| Secretary | Tomoya Tandai(Panasonic) / Fumihide Kojima(Univ. of Electro-Comm) / Osamu Muta(Sharp) / Tsutomu Murase(KDDI Research) |
| Assistant | Manabu Sakai(Mitsubishi Electric) / Masashi Iwabuchi(NTT) / Issei Kanno(KDDI Research) / Yuyuan Chang(Tokyo Inst. of Tech) / Kazuki Maruta(Tokyo Univ. of Science) |
| Paper Information | |
| Registration To | Technical Committee on Radio Communication Systems / Technical Committee on Information Networks |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Device Identification of Different Types of ZigBee Devices Based on RF Circuit Imperfections |
| Sub Title (in English) | |
| Keyword(1) | Device Identification |
| Keyword(2) | Frequency Offset |
| Keyword(3) | IQ Imbalance |
| 1st Author's Name | Kota Mizumachi |
| 1st Author's Affiliation | Tyohashi University of Technology(Toyohashi Univ. of Tech.) |
| 2nd Author's Name | Shohei Matsuoka |
| 2nd Author's Affiliation | Tyohashi University of Technology(Toyohashi Univ. of Tech.) |
| 3rd Author's Name | Kazuki Komatsu |
| 3rd Author's Affiliation | Tyohashi University of Technology(Toyohashi Univ. of Tech.) |
| 4th Author's Name | Yuichi Miyaji |
| 4th Author's Affiliation | Aichi Institute of Technology(Aichi inst. of Tech.) |
| 5th Author's Name | Hideyuki Uehara |
| 5th Author's Affiliation | Tyohashi University of Technology(Toyohashi Univ. of Tech.) |
| Date | 2023-05-25 |
| Paper # | RCS2023-15 |
| Volume (vol) | vol.123 |
| Number (no) | RCS-52 |
| Page | pp.pp.7-12(RCS), |
| #Pages | 6 |
| Date of Issue | 2023-05-18 (RCS) |