| Presentation | 2023-03-01 Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test Daisuke Goeda, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | VLD2022-74,HWS2022-45 |
| Date of Issue | 2023-02-22 (VLD, HWS) |
| Conference Information | |
| Committee | HWS / VLD |
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| Conference Date | 2023/3/1(4days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Makoto Nagata(Kobe Univ.) / Minako Ikeda(NTT) |
| Vice Chair | Yuichi Hayashi(NAIST) / Daisuke Suzuki(Mitsubishi Electric) / Shigetoshi Nakatake(Univ. of Kitakyushu) |
| Secretary | Yuichi Hayashi(Sony Semiconductor Solutions) / Daisuke Suzuki(NAIST) / Shigetoshi Nakatake(NBS) |
| Assistant | / Takuma Nishimoto(Hitachi) |
| Paper Information | |
| Registration To | Technical Committee on Hardware Security / Technical Committee on VLSI Design Technologies |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Daisuke Goeda |
| 1st Author's Affiliation | Kyoto Institute of Technology(KIT) |
| 2nd Author's Name | Tomoki Nakamura |
| 2nd Author's Affiliation | Sony Semiconductor Manufacturing Corporation(SCK) |
| 3rd Author's Name | Masuo Kajiyama |
| 3rd Author's Affiliation | Sony Semiconductor Manufacturing Corporation(SCK) |
| 4th Author's Name | Makoto Eiki |
| 4th Author's Affiliation | Sony Semiconductor Manufacturing Corporation(SCK) |
| 5th Author's Name | Michihiro Shintani |
| 5th Author's Affiliation | Kyoto Institute of Technology(KIT) |
| Date | 2023-03-01 |
| Paper # | VLD2022-74,HWS2022-45 |
| Volume (vol) | vol.122 |
| Number (no) | VLD-402,HWS-403 |
| Page | pp.pp.7-12(VLD), pp.7-12(HWS), |
| #Pages | 6 |
| Date of Issue | 2023-02-22 (VLD, HWS) |