Presentation | 2023-02-28 Locating Hotspots in a Logic Circuit and Evaluation of Hotspots Caused by an Arbitrary Test Vector Taiki Utsunomiya, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | High power consumption in LSI testing may cause excessive IR-drop. When IR-drop becomes excessive, it causes excessive delay, resulting in test malfunction. Excessive IR-drop does not occur in the entire area of circuit, but in certain areas where a large number of switching activities occur (such areas are called hotspots in this work). In order to avoid test malfunction, it is important to develop a method to reduce or control IR-drop in the specific areas. Locating areas where excessive IR-drop occur is a necessary technique to reduce or control IR-drop effectively and efficiently. In this work, we propose a method to locate hotspots in a logic circuit by switching probability calculation. Experimental results for IWLS2005 OpenCores circuits demonstrate the proposed method can locate hotspots by comparing the results of power consumption which show hotspots in various areas depending on a test pattern. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | At-speed testing / test power |
Paper # | DC2022-92 |
Date of Issue | 2023-02-21 (DC) |
Conference Information | |
Committee | DC |
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Conference Date | 2023/2/28(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
Vice Chair | Toshinori Hosokawa(Nihon Univ.) |
Secretary | Toshinori Hosokawa(Nihon Univ.) |
Assistant |
Paper Information | |
Registration To | Technical Committee on Dependable Computing |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Locating Hotspots in a Logic Circuit and Evaluation of Hotspots Caused by an Arbitrary Test Vector |
Sub Title (in English) | |
Keyword(1) | At-speed testing |
Keyword(2) | test power |
1st Author's Name | Taiki Utsunomiya |
1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
2nd Author's Name | Kohei Miyase |
2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
3rd Author's Name | Shyue-Kung Lu |
3rd Author's Affiliation | National Taiwan University of Science and Technology(NTUST) |
4th Author's Name | Xiaoqing Wen |
4th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
5th Author's Name | Seiji Kajihara |
5th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
Date | 2023-02-28 |
Paper # | DC2022-92 |
Volume (vol) | vol.122 |
Number (no) | DC-393 |
Page | pp.pp.56-61(DC), |
#Pages | 6 |
Date of Issue | 2023-02-21 (DC) |