| Presentation | 2023-02-28 A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints Lele Jiang, Tatsuhiro Tsuchiya, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper focuses on the problem of constraint representation for the generation of t-way test sequences. T-way sequence testing is a technique for testing event-driven systems. This technique tests all combinations of t events in all possible orders. Event-driven systems often have constraints on the order of executable events that must be satisfied by every test case. To express the constraints, we propose a notation that is easy to understand as well as machine-readable. The proposed notation only uses basic mathematical operators, thus allowing users to express complex constraints without understanding special operators. We develop a system that automatically generates a set of test cases that meet the constraints represented in the proposed notation. From the results of applying the system to a real-life case study, it is found the notation is intuitive and easy to understand and that the system can generate test cases within a practical time. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Test Sequence GenerationSequencing ConstraintT-way Sequence CoverageSequence TestingEvent-based TestingCombinatorial Testing |
| Paper # | DC2022-85 |
| Date of Issue | 2023-02-21 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2023/2/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Vice Chair | Toshinori Hosokawa(Nihon Univ.) |
| Secretary | Toshinori Hosokawa(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints |
| Sub Title (in English) | |
| Keyword(1) | Test Sequence GenerationSequencing ConstraintT-way Sequence CoverageSequence TestingEvent-based TestingCombinatorial Testing |
| 1st Author's Name | Lele Jiang |
| 1st Author's Affiliation | Osaka University(Osaka Univ.) |
| 2nd Author's Name | Tatsuhiro Tsuchiya |
| 2nd Author's Affiliation | Osaka University(Osaka Univ.) |
| Date | 2023-02-28 |
| Paper # | DC2022-85 |
| Volume (vol) | vol.122 |
| Number (no) | DC-393 |
| Page | pp.pp.16-20(DC), |
| #Pages | 5 |
| Date of Issue | 2023-02-21 (DC) |