Presentation 2023-02-28
A Test Generation Method to Identify Multiple Fault Pairs for Improved Fault Diagnosis Resolution
Yuya Chida, Toshinori Hosokawa, Koji Yamazaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English) diagnostic test generation / fault diagnosis / register transfer level, / unidentifiable fault pairs / Partial Max SAT
Paper # DC2022-83
Date of Issue 2023-02-21 (DC)

Conference Information
Committee DC
Conference Date 2023/2/28(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Vice Chair Toshinori Hosokawa(Nihon Univ.)
Secretary Toshinori Hosokawa(Nihon Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Generation Method to Identify Multiple Fault Pairs for Improved Fault Diagnosis Resolution
Sub Title (in English)
Keyword(1) diagnostic test generation
Keyword(2) fault diagnosis
Keyword(3) register transfer level,
Keyword(4) unidentifiable fault pairs
Keyword(5) Partial Max SAT
1st Author's Name Yuya Chida
1st Author's Affiliation Nihon University(NIhon Univ.)
2nd Author's Name Toshinori Hosokawa
2nd Author's Affiliation Nihon University(NIhon Univ.)
3rd Author's Name Koji Yamazaki
3rd Author's Affiliation Meiji University(Meiji Univ.)
Date 2023-02-28
Paper # DC2022-83
Volume (vol) vol.122
Number (no) DC-393
Page pp.pp.6-11(DC),
#Pages 6
Date of Issue 2023-02-21 (DC)