| Presentation | 2023-01-26 Clock Fingerprint Identification Method Using Goodness of Fit Test Asu Kobayashi, Naoto Hoshikawa, Atsushi Shiraki, Tomoyoshi Ito, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the increase in the number of IoT devices, the danger of device substitution and spoofing has increased, and appropriate device identification methods have become increasingly important. We are investigating a device identification method based on the fact that the time drift inherent in digital devices is represented by a cubic function of CPU core temperature. In our previous work, we proposed an identification method using the variance of the residuals between the regression curve of the time drift and the measured values. However, if even one measured value of a legitimate device was obtained by a malicious third person, it could be used repeatedly to impersonate the legitimate device. To prevent this, we proposed an identification method using a goodness-of-fit test. We also evaluated the identification performance when the number of measurements is varied and when the measurements of spoofed devices are mixed in. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | IoT / system time / time drift / CPU / identification / constant temperature chamber |
| Paper # | NS2022-154 |
| Date of Issue | 2023-01-19 (NS) |
| Conference Information | |
| Committee | NS |
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| Conference Date | 2023/1/26(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hybrid Meeting (Yamaguchi Prefecture) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Network software (Software architecture, Middleware), Network application, SOA/SDP, NGN/IMS/API, Distributed control/Dynamic routing, Grid, NFV, IoT, Network/System reliability, Network/System evaluation, etc. |
| Chair | Tetsuya Oishi(NTT) |
| Vice Chair | Takumi Miyoshi(Shibaura Insti of Tech.) |
| Secretary | Takumi Miyoshi(NTT) |
| Assistant | Kotaro Mihara(NTT) |
| Paper Information | |
| Registration To | Technical Committee on Network Systems |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Clock Fingerprint Identification Method Using Goodness of Fit Test |
| Sub Title (in English) | |
| Keyword(1) | IoT |
| Keyword(2) | system time |
| Keyword(3) | time drift |
| Keyword(4) | CPU |
| Keyword(5) | identification |
| Keyword(6) | constant temperature chamber |
| 1st Author's Name | Asu Kobayashi |
| 1st Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
| 2nd Author's Name | Naoto Hoshikawa |
| 2nd Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
| 3rd Author's Name | Atsushi Shiraki |
| 3rd Author's Affiliation | Chiba University(Chiba Univ.) |
| 4th Author's Name | Tomoyoshi Ito |
| 4th Author's Affiliation | Chiba University(Chiba Univ.) |
| Date | 2023-01-26 |
| Paper # | NS2022-154 |
| Volume (vol) | vol.122 |
| Number (no) | NS-362 |
| Page | pp.pp.25-30(NS), |
| #Pages | 6 |
| Date of Issue | 2023-01-19 (NS) |