| Presentation | 2023-01-27 Measurement Evaluation of Bias Dependence of Single-Input Broadband GaN Amplifier Yuki Nakagawa, Takana Kaho, Shuichi Sakata, Yuji Komatsuzaki, Koji Yamanaka, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We are researching a broadband GaN amplifier for 4G/5G base stations covering a 4GHz band from 800MHz to 4.8GHz. We aim to improve efficiency by operating as a Doherty amplifier or an outphasing amplifier for each frequency band. To investigate characteristics such as output power, gain, efficiency, EVM, etc. while controlling the gate voltage of two GaN HEMTs for each band, broadband amplifiers had the problem of increasing the amount of measurement. A measurement system was constructed by combining a vector transceiver, a source measure unit, and a power sensor in a PXI system for a single-input amplifier, and a program for automatic measurement was developed using LabVIEW and MATLAB. This report describes the details of the measurement system and program. We report on the measurement evaluation results of amplifiers in the 3.8 GHz band. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Power amplifier / broadband / GaN / bias dependence |
| Paper # | ED2022-89,MW2022-148 |
| Date of Issue | 2023-01-20 (ED, MW) |
| Conference Information | |
| Committee | MW / ED |
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| Conference Date | 2023/1/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Noriharu Suematsu(Tohoku Univ.) / Hiroki Fujishiro(Tokyo Univ. of Science) |
| Vice Chair | Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Hideyuki Nakamizo(Mitsubishi Electric) / Seiya Sakai(Hokkaido Univ.) |
| Secretary | Tadashi Kawai(Univ. of Electro-Comm) / Kensuke Okubo(Toshiba) / Hideyuki Nakamizo(Saga Univ.) / Seiya Sakai(NTT) |
| Assistant | Naoki Hasegawa(Softbank) / Kosuke Katayama(NIT Tokuyama College) / Masatoshi Koyama(Osaka Inst. of Tech.) / Yoshitugu Yamamoto(Mitsubishi Electric) |
| Paper Information | |
| Registration To | Technical Committee on Microwaves / Technical Committee on Electron Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Measurement Evaluation of Bias Dependence of Single-Input Broadband GaN Amplifier |
| Sub Title (in English) | |
| Keyword(1) | Power amplifier |
| Keyword(2) | broadband |
| Keyword(3) | GaN |
| Keyword(4) | bias dependence |
| 1st Author's Name | Yuki Nakagawa |
| 1st Author's Affiliation | Shonan Institute of Technology(Shonan Inst. Tech.) |
| 2nd Author's Name | Takana Kaho |
| 2nd Author's Affiliation | Shonan Institute of Technology(Shonan Inst. Tech.) |
| 3rd Author's Name | Shuichi Sakata |
| 3rd Author's Affiliation | Mitsubishi Electric Corporation(MELCO) |
| 4th Author's Name | Yuji Komatsuzaki |
| 4th Author's Affiliation | Mitsubishi Electric Corporation(MELCO) |
| 5th Author's Name | Koji Yamanaka |
| 5th Author's Affiliation | Mitsubishi Electric Corporation(MELCO) |
| Date | 2023-01-27 |
| Paper # | ED2022-89,MW2022-148 |
| Volume (vol) | vol.122 |
| Number (no) | ED-370,MW-371 |
| Page | pp.pp.19-24(ED), pp.19-24(MW), |
| #Pages | 6 |
| Date of Issue | 2023-01-20 (ED, MW) |