| Presentation | 2022-12-16 On Improving the Accuracy of LSI Small Delay Fault Diagnosis Shinnosuke Fujita, Stefan Holst, Xiaoqing Wen, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With today's tight timing margins, increasing manufacturing variation, and the development of nanometer technology, timing-related defects have become a major concern in the development of LSI technology. Therefore, detailed information on SDD (Small Delay Defect) is needed. In addition, variations in the delay values of each element in LSI manufacturing have come to affect circuits. Therefore, it is necessary to perform fault diagnosis taking the variations into account. In this study, we propose a diagnostic algorithm specifically designed to diagnose timing problems under compressed test responses and process variations. We report the results of the algorithm with a new process for the case of a large number of SDD candidates that were not diagnosed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Small Delay Defect / Delay Fault / Fault Diagnosis |
| Paper # | DC2022-72 |
| Date of Issue | 2022-12-09 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2022/12/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Safety, etc. |
| Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Vice Chair | Toshinori Hosokawa(Nihon Univ.) |
| Secretary | Toshinori Hosokawa(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Improving the Accuracy of LSI Small Delay Fault Diagnosis |
| Sub Title (in English) | |
| Keyword(1) | Small Delay Defect |
| Keyword(2) | Delay Fault |
| Keyword(3) | Fault Diagnosis |
| 1st Author's Name | Shinnosuke Fujita |
| 1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 2nd Author's Name | Stefan Holst |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Xiaoqing Wen |
| 3rd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| Date | 2022-12-16 |
| Paper # | DC2022-72 |
| Volume (vol) | vol.122 |
| Number (no) | DC-318 |
| Page | pp.pp.1-6(DC), |
| #Pages | 6 |
| Date of Issue | 2022-12-09 (DC) |