Presentation 2022-11-17
Process capability index for reliability evaluation
Toshinari Mastsuoka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Optimize the tolerance limits of the process capability index to obtain the reliability to achieve the target quality.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Process Capability Index / Process Performance Index / Robustness / Reliability / Qualification
Paper # R2022-43
Date of Issue 2022-11-10 (R)

Conference Information
Committee R
Conference Date 2022/11/17(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general
Chair Tadashi Dohi(Hiroshima Univ.)
Vice Chair Yasushi Kadota(Ricoh)
Secretary Yasushi Kadota(Hiroshima Univ.)
Assistant Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Takenori Sakumura(Housei Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Process capability index for reliability evaluation
Sub Title (in English)
Keyword(1) Process Capability Index
Keyword(2) Process Performance Index
Keyword(3) Robustness
Keyword(4) Reliability
Keyword(5) Qualification
1st Author's Name Toshinari Mastsuoka
1st Author's Affiliation Mitsubishi Electric Corporation(MELCO)
Date 2022-11-17
Paper # R2022-43
Volume (vol) vol.122
Number (no) R-257
Page pp.pp.17-22(R),
#Pages 6
Date of Issue 2022-11-10 (R)