Presentation | 2022-11-17 Process capability index for reliability evaluation Toshinari Mastsuoka, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Optimize the tolerance limits of the process capability index to obtain the reliability to achieve the target quality. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Process Capability Index / Process Performance Index / Robustness / Reliability / Qualification |
Paper # | R2022-43 |
Date of Issue | 2022-11-10 (R) |
Conference Information | |
Committee | R |
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Conference Date | 2022/11/17(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Reliability of semiconductor and electronic devices, Reliability general |
Chair | Tadashi Dohi(Hiroshima Univ.) |
Vice Chair | Yasushi Kadota(Ricoh) |
Secretary | Yasushi Kadota(Hiroshima Univ.) |
Assistant | Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Takenori Sakumura(Housei Univ.) |
Paper Information | |
Registration To | Technical Committee on Reliability |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Process capability index for reliability evaluation |
Sub Title (in English) | |
Keyword(1) | Process Capability Index |
Keyword(2) | Process Performance Index |
Keyword(3) | Robustness |
Keyword(4) | Reliability |
Keyword(5) | Qualification |
1st Author's Name | Toshinari Mastsuoka |
1st Author's Affiliation | Mitsubishi Electric Corporation(MELCO) |
Date | 2022-11-17 |
Paper # | R2022-43 |
Volume (vol) | vol.122 |
Number (no) | R-257 |
Page | pp.pp.17-22(R), |
#Pages | 6 |
Date of Issue | 2022-11-10 (R) |